Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components

Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components

An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a mxn array of FETs, without specified internal connections between the integrated circuit components, wherein m is greater than two. The integrated circuit device fu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HAENSCH WILFRIED E, GETTINGS KAREN M.G.V, KETCHEN MARK B, BHUSHAN MANJUL, JI BRIAN L
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HAENSCH WILFRIED E
GETTINGS KAREN M.G.V
KETCHEN MARK B
BHUSHAN MANJUL
JI BRIAN L
description An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a mxn array of FETs, without specified internal connections between the integrated circuit components, wherein m is greater than two. The integrated circuit device further includes at least one second array configuration of integrated circuit components comprising an array of integrated circuit components nominally identical to those of the first array configuration, with specified internal connections between integrated circuit components. A variation coefficient is determined for the integrated circuit components based on a measured specified parameter of the first array configuration and the second array configuration.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2008142848A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2008142848A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2008142848A13</originalsourceid><addsrcrecordid>eNqNi7sKwjAUQLs4iPoPF5yFtnbIWoKiQycf4FSuzY0G0iQkN4N_bwY_wOkM55xl9RiI314lQKegDwEjck6gfYSzs8YR3DEafBpr-AMDYcqRZnIMXpeC6VUGUiBNnLJhkH4O3hWf1tVCo020-XFVbY-HqzztKPiRUsCJHPF4u7R1LZquFZ3om_1_1RfH5zu3</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components</title><source>esp@cenet</source><creator>HAENSCH WILFRIED E ; GETTINGS KAREN M.G.V ; KETCHEN MARK B ; BHUSHAN MANJUL ; JI BRIAN L</creator><creatorcontrib>HAENSCH WILFRIED E ; GETTINGS KAREN M.G.V ; KETCHEN MARK B ; BHUSHAN MANJUL ; JI BRIAN L</creatorcontrib><description>An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a mxn array of FETs, without specified internal connections between the integrated circuit components, wherein m is greater than two. The integrated circuit device further includes at least one second array configuration of integrated circuit components comprising an array of integrated circuit components nominally identical to those of the first array configuration, with specified internal connections between integrated circuit components. A variation coefficient is determined for the integrated circuit components based on a measured specified parameter of the first array configuration and the second array configuration.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080619&amp;DB=EPODOC&amp;CC=US&amp;NR=2008142848A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080619&amp;DB=EPODOC&amp;CC=US&amp;NR=2008142848A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAENSCH WILFRIED E</creatorcontrib><creatorcontrib>GETTINGS KAREN M.G.V</creatorcontrib><creatorcontrib>KETCHEN MARK B</creatorcontrib><creatorcontrib>BHUSHAN MANJUL</creatorcontrib><creatorcontrib>JI BRIAN L</creatorcontrib><title>Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components</title><description>An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a mxn array of FETs, without specified internal connections between the integrated circuit components, wherein m is greater than two. The integrated circuit device further includes at least one second array configuration of integrated circuit components comprising an array of integrated circuit components nominally identical to those of the first array configuration, with specified internal connections between integrated circuit components. A variation coefficient is determined for the integrated circuit components based on a measured specified parameter of the first array configuration and the second array configuration.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi7sKwjAUQLs4iPoPF5yFtnbIWoKiQycf4FSuzY0G0iQkN4N_bwY_wOkM55xl9RiI314lQKegDwEjck6gfYSzs8YR3DEafBpr-AMDYcqRZnIMXpeC6VUGUiBNnLJhkH4O3hWf1tVCo020-XFVbY-HqzztKPiRUsCJHPF4u7R1LZquFZ3om_1_1RfH5zu3</recordid><startdate>20080619</startdate><enddate>20080619</enddate><creator>HAENSCH WILFRIED E</creator><creator>GETTINGS KAREN M.G.V</creator><creator>KETCHEN MARK B</creator><creator>BHUSHAN MANJUL</creator><creator>JI BRIAN L</creator><scope>EVB</scope></search><sort><creationdate>20080619</creationdate><title>Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components</title><author>HAENSCH WILFRIED E ; GETTINGS KAREN M.G.V ; KETCHEN MARK B ; BHUSHAN MANJUL ; JI BRIAN L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2008142848A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HAENSCH WILFRIED E</creatorcontrib><creatorcontrib>GETTINGS KAREN M.G.V</creatorcontrib><creatorcontrib>KETCHEN MARK B</creatorcontrib><creatorcontrib>BHUSHAN MANJUL</creatorcontrib><creatorcontrib>JI BRIAN L</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAENSCH WILFRIED E</au><au>GETTINGS KAREN M.G.V</au><au>KETCHEN MARK B</au><au>BHUSHAN MANJUL</au><au>JI BRIAN L</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components</title><date>2008-06-19</date><risdate>2008</risdate><abstract>An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a mxn array of FETs, without specified internal connections between the integrated circuit components, wherein m is greater than two. The integrated circuit device further includes at least one second array configuration of integrated circuit components comprising an array of integrated circuit components nominally identical to those of the first array configuration, with specified internal connections between integrated circuit components. A variation coefficient is determined for the integrated circuit components based on a measured specified parameter of the first array configuration and the second array configuration.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2008142848A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T00%3A38%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HAENSCH%20WILFRIED%20E&rft.date=2008-06-19&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2008142848A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true