NON-DESTRUCTIVE EXAMINATION APPARATUS AND METHOD FOR GUIDED WAVES

NON-DESTRUCTIVE EXAMINATION APPARATUS AND METHOD FOR GUIDED WAVES

A method of performing a non-destructive examination of a piece of material, having the steps of providing an angle beam wedge and at least two transducers placed upon the wedge, wherein the transducers are placed in a phased array, placing the wedge upon the piece of material to be examined, produc...

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Hauptverfasser: OWENS STEVEN E, ROYER ROGER L, ROSE JOSEPH L
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator OWENS STEVEN E
ROYER ROGER L
ROSE JOSEPH L
description A method of performing a non-destructive examination of a piece of material, having the steps of providing an angle beam wedge and at least two transducers placed upon the wedge, wherein the transducers are placed in a phased array, placing the wedge upon the piece of material to be examined, producing a guided wave into the piece of material to be examined, wherein the guided wave is placed into the material through a synthetically changed incident angle, receiving the guided wave from the piece of material, and determining one of a presence of defects and lack of defects in the piece of material from the received guided wave. Transducers used may include 360 degree guided wave, radial polarized units, parallel shear units for shear horizontal activation and guided wave wheel probes.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title NON-DESTRUCTIVE EXAMINATION APPARATUS AND METHOD FOR GUIDED WAVES
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