METHOD FOR THE EVALUATION OF MEASUREMENT UNCERTAINTY, AND A DEVICE AND SYSTEM THEREOF
A method of evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test comprising providing a mathematical model wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference value of...
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creator | ENDO TADASHI YOSHIHIRO KAZUO |
description | A method of evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test comprising providing a mathematical model wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference value of said physically observable quantity in a reference device; measuring the reference value of the reference device and the value of the measurand of the device under test; measuring the value of said at least one physically observable quantity; and determining at least one uncertainty value as a function of said physically observable quantity from said mathematical model, wherein the mathematical model takes into account the at least one source of uncertainty and the reference value of the reference device. |
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measuring the reference value of the reference device and the value of the measurand of the device under test; measuring the value of said at least one physically observable quantity; and determining at least one uncertainty value as a function of said physically observable quantity from said mathematical model, wherein the mathematical model takes into account the at least one source of uncertainty and the reference value of the reference device.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL ; METERING BY VOLUME ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080529&DB=EPODOC&CC=US&NR=2008125982A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080529&DB=EPODOC&CC=US&NR=2008125982A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ENDO TADASHI</creatorcontrib><creatorcontrib>YOSHIHIRO KAZUO</creatorcontrib><title>METHOD FOR THE EVALUATION OF MEASUREMENT UNCERTAINTY, AND A DEVICE AND SYSTEM THEREOF</title><description>A method of evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test comprising providing a mathematical model wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference value of said physically observable quantity in a reference device; measuring the reference value of the reference device and the value of the measurand of the device under test; measuring the value of said at least one physically observable quantity; and determining at least one uncertainty value as a function of said physically observable quantity from said mathematical model, wherein the mathematical model takes into account the at least one source of uncertainty and the reference value of the reference device.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL</subject><subject>METERING BY VOLUME</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjEEKwjAQAHPxIOofFrwqtBGhPS7JhgZMAsmm0FMpEk-ihfp_RPEBnoaBYdYiO-IuaDAhAncE1OMlI9vgIRhwhClHcuQZslcUGa3n4QDoNSBo6q2ir6QhMbnPIlIwW7G6Tfel7H7ciL0hVt2xzM-xLPN0LY_yGnOSVdXU8tw2EuvTf9UbAgUxIQ</recordid><startdate>20080529</startdate><enddate>20080529</enddate><creator>ENDO TADASHI</creator><creator>YOSHIHIRO KAZUO</creator><scope>EVB</scope></search><sort><creationdate>20080529</creationdate><title>METHOD FOR THE EVALUATION OF MEASUREMENT UNCERTAINTY, AND A DEVICE AND SYSTEM THEREOF</title><author>ENDO TADASHI ; 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measuring the reference value of the reference device and the value of the measurand of the device under test; measuring the value of said at least one physically observable quantity; and determining at least one uncertainty value as a function of said physically observable quantity from said mathematical model, wherein the mathematical model takes into account the at least one source of uncertainty and the reference value of the reference device.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TARIFF METERING APPARATUS TESTING |
title | METHOD FOR THE EVALUATION OF MEASUREMENT UNCERTAINTY, AND A DEVICE AND SYSTEM THEREOF |
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