METHOD FOR THE EVALUATION OF MEASUREMENT UNCERTAINTY, AND A DEVICE AND SYSTEM THEREOF

A method of evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test comprising providing a mathematical model wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference value of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	ENDO TADASHI, YOSHIHIRO KAZUO
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A method of evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test comprising providing a mathematical model wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference value of said physically observable quantity in a reference device; measuring the reference value of the reference device and the value of the measurand of the device under test; measuring the value of said at least one physically observable quantity; and determining at least one uncertainty value as a function of said physically observable quantity from said mathematical model, wherein the mathematical model takes into account the at least one source of uncertainty and the reference value of the reference device.