Semiconductor Scheme for Reduced Circuit Area in a Simplified Process
An apparatus and method are disclosed for an improved semiconductor interconnect scheme using a simplified process. In an embodiment of the apparatus, a polysilicon shape is formed on a silicon area. The polysilicon shape is created having a bridging vertex. When a spacer is created on the polysilic...
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creator | DONZE RICHARD L KUEPER TERRANCE W HOVIS WILLIAM P SHEETS JOHN E.II CHRISTENSEN TODD A |
description | An apparatus and method are disclosed for an improved semiconductor interconnect scheme using a simplified process. In an embodiment of the apparatus, a polysilicon shape is formed on a silicon area. The polysilicon shape is created having a bridging vertex. When a spacer is created on the polysilicon shape, the spacer width is formed to be small enough near the bridging vertex to allow a silicide bridge to form that creates an electrical coupling between the silicon area and the bridging vertex. Semiconductor devices and circuits are created using the improved semiconductor interconnect scheme using the simplified process. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2008102627A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2008102627A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2008102627A13</originalsourceid><addsrcrecordid>eNrjZHANTs3NTM7PSylNLskvUghOzkjNTVVIAzKDUoFiqSkKzplFyaWZJQqORamJCpl5CokKwZm5BTmZaZlAyYCi_OTU4mIeBta0xJziVF4ozc2g7OYa4uyhm1qQH59aXJCYnJqXWhIfGmxkYGBhaGBkZmTuaGhMnCoAZ4IzWA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Semiconductor Scheme for Reduced Circuit Area in a Simplified Process</title><source>esp@cenet</source><creator>DONZE RICHARD L ; KUEPER TERRANCE W ; HOVIS WILLIAM P ; SHEETS JOHN E.II ; CHRISTENSEN TODD A</creator><creatorcontrib>DONZE RICHARD L ; KUEPER TERRANCE W ; HOVIS WILLIAM P ; SHEETS JOHN E.II ; CHRISTENSEN TODD A</creatorcontrib><description>An apparatus and method are disclosed for an improved semiconductor interconnect scheme using a simplified process. In an embodiment of the apparatus, a polysilicon shape is formed on a silicon area. The polysilicon shape is created having a bridging vertex. When a spacer is created on the polysilicon shape, the spacer width is formed to be small enough near the bridging vertex to allow a silicide bridge to form that creates an electrical coupling between the silicon area and the bridging vertex. Semiconductor devices and circuits are created using the improved semiconductor interconnect scheme using the simplified process.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080501&DB=EPODOC&CC=US&NR=2008102627A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080501&DB=EPODOC&CC=US&NR=2008102627A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DONZE RICHARD L</creatorcontrib><creatorcontrib>KUEPER TERRANCE W</creatorcontrib><creatorcontrib>HOVIS WILLIAM P</creatorcontrib><creatorcontrib>SHEETS JOHN E.II</creatorcontrib><creatorcontrib>CHRISTENSEN TODD A</creatorcontrib><title>Semiconductor Scheme for Reduced Circuit Area in a Simplified Process</title><description>An apparatus and method are disclosed for an improved semiconductor interconnect scheme using a simplified process. In an embodiment of the apparatus, a polysilicon shape is formed on a silicon area. The polysilicon shape is created having a bridging vertex. When a spacer is created on the polysilicon shape, the spacer width is formed to be small enough near the bridging vertex to allow a silicide bridge to form that creates an electrical coupling between the silicon area and the bridging vertex. Semiconductor devices and circuits are created using the improved semiconductor interconnect scheme using the simplified process.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHANTs3NTM7PSylNLskvUghOzkjNTVVIAzKDUoFiqSkKzplFyaWZJQqORamJCpl5CokKwZm5BTmZaZlAyYCi_OTU4mIeBta0xJziVF4ozc2g7OYa4uyhm1qQH59aXJCYnJqXWhIfGmxkYGBhaGBkZmTuaGhMnCoAZ4IzWA</recordid><startdate>20080501</startdate><enddate>20080501</enddate><creator>DONZE RICHARD L</creator><creator>KUEPER TERRANCE W</creator><creator>HOVIS WILLIAM P</creator><creator>SHEETS JOHN E.II</creator><creator>CHRISTENSEN TODD A</creator><scope>EVB</scope></search><sort><creationdate>20080501</creationdate><title>Semiconductor Scheme for Reduced Circuit Area in a Simplified Process</title><author>DONZE RICHARD L ; KUEPER TERRANCE W ; HOVIS WILLIAM P ; SHEETS JOHN E.II ; CHRISTENSEN TODD A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2008102627A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>DONZE RICHARD L</creatorcontrib><creatorcontrib>KUEPER TERRANCE W</creatorcontrib><creatorcontrib>HOVIS WILLIAM P</creatorcontrib><creatorcontrib>SHEETS JOHN E.II</creatorcontrib><creatorcontrib>CHRISTENSEN TODD A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DONZE RICHARD L</au><au>KUEPER TERRANCE W</au><au>HOVIS WILLIAM P</au><au>SHEETS JOHN E.II</au><au>CHRISTENSEN TODD A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Semiconductor Scheme for Reduced Circuit Area in a Simplified Process</title><date>2008-05-01</date><risdate>2008</risdate><abstract>An apparatus and method are disclosed for an improved semiconductor interconnect scheme using a simplified process. In an embodiment of the apparatus, a polysilicon shape is formed on a silicon area. The polysilicon shape is created having a bridging vertex. When a spacer is created on the polysilicon shape, the spacer width is formed to be small enough near the bridging vertex to allow a silicide bridge to form that creates an electrical coupling between the silicon area and the bridging vertex. Semiconductor devices and circuits are created using the improved semiconductor interconnect scheme using the simplified process.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Semiconductor Scheme for Reduced Circuit Area in a Simplified Process |
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