Analyzer
Analyzers are described that include a display for displaying a screen selected from a plurality of screens, which may display a hierarchical menu corresponding to a predetermined screen.
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creator | NAITO TAKAMICHI ONOMICHI HIROMI |
description | Analyzers are described that include a display for displaying a screen selected from a plurality of screens, which may display a hierarchical menu corresponding to a predetermined screen. |
format | Patent |
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CONTROLLING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080207&DB=EPODOC&CC=US&NR=2008033580A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080207&DB=EPODOC&CC=US&NR=2008033580A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAITO TAKAMICHI</creatorcontrib><creatorcontrib>ONOMICHI HIROMI</creatorcontrib><title>Analyzer</title><description>Analyzers are described that include a display for displaying a screen selected from a plurality of screens, which may display a hierarchical menu corresponding to a predetermined screen.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOBwzEvMqaxKLeJhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGBhYGxsamFgaOhsbEqQIA6bMdIw</recordid><startdate>20080207</startdate><enddate>20080207</enddate><creator>NAITO TAKAMICHI</creator><creator>ONOMICHI HIROMI</creator><scope>EVB</scope></search><sort><creationdate>20080207</creationdate><title>Analyzer</title><author>NAITO TAKAMICHI ; 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language | eng |
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subjects | CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING |
title | Analyzer |
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