Quality Assurance System and Method

Systems, processes, and devices may facilitate quality assurance in a manufacturing process. In certain implementations, systems, processes, and devices for quality assurance may include the ability to receive inspection data regarding an item being manufactured, the item having a number of componen...

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Hauptverfasser: DENOMME MICHAEL A, SHARMA PARIT K
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creator DENOMME MICHAEL A
SHARMA PARIT K
description Systems, processes, and devices may facilitate quality assurance in a manufacturing process. In certain implementations, systems, processes, and devices for quality assurance may include the ability to receive inspection data regarding an item being manufactured, the item having a number of components, and insert the data into a data organization. The data organization may include a first data structure for capturing identification data regarding the item and the inspections for the item, a second data structure for capturing data regarding defects in the item's components, and a third data structure for capturing data regarding the item's components. A fourth data structure may be linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the item's components, and the components containing the defects. The data organization may be used to generate responses to queries.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2008016119A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2008016119A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2008016119A13</originalsourceid><addsrcrecordid>eNrjZFAOLE3MySypVHAsLi4tSsxLTlUIriwuSc1VSMxLUfBNLcnIT-FhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGBhYGhmaGhpaOhsbEqQIAZ20nHQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Quality Assurance System and Method</title><source>esp@cenet</source><creator>DENOMME MICHAEL A ; SHARMA PARIT K</creator><creatorcontrib>DENOMME MICHAEL A ; SHARMA PARIT K</creatorcontrib><description>Systems, processes, and devices may facilitate quality assurance in a manufacturing process. In certain implementations, systems, processes, and devices for quality assurance may include the ability to receive inspection data regarding an item being manufactured, the item having a number of components, and insert the data into a data organization. The data organization may include a first data structure for capturing identification data regarding the item and the inspections for the item, a second data structure for capturing data regarding defects in the item's components, and a third data structure for capturing data regarding the item's components. A fourth data structure may be linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the item's components, and the components containing the defects. The data organization may be used to generate responses to queries.</description><language>eng</language><subject>CALCULATING ; CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC ; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS ; TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080117&amp;DB=EPODOC&amp;CC=US&amp;NR=2008016119A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080117&amp;DB=EPODOC&amp;CC=US&amp;NR=2008016119A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DENOMME MICHAEL A</creatorcontrib><creatorcontrib>SHARMA PARIT K</creatorcontrib><title>Quality Assurance System and Method</title><description>Systems, processes, and devices may facilitate quality assurance in a manufacturing process. In certain implementations, systems, processes, and devices for quality assurance may include the ability to receive inspection data regarding an item being manufactured, the item having a number of components, and insert the data into a data organization. The data organization may include a first data structure for capturing identification data regarding the item and the inspections for the item, a second data structure for capturing data regarding defects in the item's components, and a third data structure for capturing data regarding the item's components. A fourth data structure may be linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the item's components, and the components containing the defects. The data organization may be used to generate responses to queries.</description><subject>CALCULATING</subject><subject>CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</subject><subject>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><subject>TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAOLE3MySypVHAsLi4tSsxLTlUIriwuSc1VSMxLUfBNLcnIT-FhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGBhYGhmaGhpaOhsbEqQIAZ20nHQ</recordid><startdate>20080117</startdate><enddate>20080117</enddate><creator>DENOMME MICHAEL A</creator><creator>SHARMA PARIT K</creator><scope>EVB</scope></search><sort><creationdate>20080117</creationdate><title>Quality Assurance System and Method</title><author>DENOMME MICHAEL A ; SHARMA PARIT K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2008016119A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>CALCULATING</topic><topic>CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</topic><topic>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</topic><topic>TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE</topic><toplevel>online_resources</toplevel><creatorcontrib>DENOMME MICHAEL A</creatorcontrib><creatorcontrib>SHARMA PARIT K</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DENOMME MICHAEL A</au><au>SHARMA PARIT K</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Quality Assurance System and Method</title><date>2008-01-17</date><risdate>2008</risdate><abstract>Systems, processes, and devices may facilitate quality assurance in a manufacturing process. In certain implementations, systems, processes, and devices for quality assurance may include the ability to receive inspection data regarding an item being manufactured, the item having a number of components, and insert the data into a data organization. The data organization may include a first data structure for capturing identification data regarding the item and the inspections for the item, a second data structure for capturing data regarding defects in the item's components, and a third data structure for capturing data regarding the item's components. A fourth data structure may be linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the item's components, and the components containing the defects. The data organization may be used to generate responses to queries.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE
title Quality Assurance System and Method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T06%3A09%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DENOMME%20MICHAEL%20A&rft.date=2008-01-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2008016119A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true