System and Method for Projecting a Pattern from a Mask onto a Substrate

A system for projecting a pattern from a mask onto a substrate comprises a radiation source for emitting a light beam in the extreme ultraviolet wavelength range, a mask including absorbent and reflective structures forming the pattern, a collector mirror and an illumination optical system forming a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PFORR RAINER, KAMM FRANK-MICHAEL
Format: Patent
Sprache:eng
Schlagworte:
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