Method for patterning a radiation beam, patterning device for patterning a radiation beam

A multiple-die mask pattern is arranged with dies having the same pattern in mutually opposite orientations. The method for arranging the dies includes analyzing the pattern of a single die to identify a pattern characteristic property which is non uniformly distributed over the area of the die. If...

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Bibliographische Detailangaben
Hauptverfasser: VREUGDENHIL EWOUD, DE BOEIJ WILHELMUS P, DE KLERK JOHANNES W, DE GROOT SIMON
Format: Patent
Sprache:eng
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