Method For Producing A Polished Semiconductor

Semiconductor wafers are cut from a crystal and subjected to a series of processing steps in which material is removed from a front side and a rear side of the semiconductor wafers, comprising the following processing steps: a mechanical processing step, an etching step in which the semiconductor wa...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: STADLER MAXIMILIAN, LANGSDORF KARLHEINZ, SCHWAB GUNTER, FEIJOO DIEGO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator STADLER MAXIMILIAN
LANGSDORF KARLHEINZ
SCHWAB GUNTER
FEIJOO DIEGO
description Semiconductor wafers are cut from a crystal and subjected to a series of processing steps in which material is removed from a front side and a rear side of the semiconductor wafers, comprising the following processing steps: a mechanical processing step, an etching step in which the semiconductor wafers are oxidized and material is removed from the front side of the wafers with the aid of a gaseous etchant containing hydrofluoric acid at a temperature of 20 to 70° C., and a polishing step in which the front side of the semiconductor wafer is polished, the processing steps in which the front side of the semiconductor wafer is polished causing material removal which does not amount to more than 5 mum in total.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2007259531A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2007259531A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2007259531A13</originalsourceid><addsrcrecordid>eNrjZND1TS3JyE9RcMsvUggoyk8pTc7MS1dwVAjIz8kszkhNUQhOzc1Mzs8DSpTkF_EwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDA3MjU0tTY0NHQ2PiVAEAOCoqtw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method For Producing A Polished Semiconductor</title><source>esp@cenet</source><creator>STADLER MAXIMILIAN ; LANGSDORF KARLHEINZ ; SCHWAB GUNTER ; FEIJOO DIEGO</creator><creatorcontrib>STADLER MAXIMILIAN ; LANGSDORF KARLHEINZ ; SCHWAB GUNTER ; FEIJOO DIEGO</creatorcontrib><description>Semiconductor wafers are cut from a crystal and subjected to a series of processing steps in which material is removed from a front side and a rear side of the semiconductor wafers, comprising the following processing steps: a mechanical processing step, an etching step in which the semiconductor wafers are oxidized and material is removed from the front side of the wafers with the aid of a gaseous etchant containing hydrofluoric acid at a temperature of 20 to 70° C., and a polishing step in which the front side of the semiconductor wafer is polished, the processing steps in which the front side of the semiconductor wafer is polished causing material removal which does not amount to more than 5 mum in total.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20071108&amp;DB=EPODOC&amp;CC=US&amp;NR=2007259531A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20071108&amp;DB=EPODOC&amp;CC=US&amp;NR=2007259531A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STADLER MAXIMILIAN</creatorcontrib><creatorcontrib>LANGSDORF KARLHEINZ</creatorcontrib><creatorcontrib>SCHWAB GUNTER</creatorcontrib><creatorcontrib>FEIJOO DIEGO</creatorcontrib><title>Method For Producing A Polished Semiconductor</title><description>Semiconductor wafers are cut from a crystal and subjected to a series of processing steps in which material is removed from a front side and a rear side of the semiconductor wafers, comprising the following processing steps: a mechanical processing step, an etching step in which the semiconductor wafers are oxidized and material is removed from the front side of the wafers with the aid of a gaseous etchant containing hydrofluoric acid at a temperature of 20 to 70° C., and a polishing step in which the front side of the semiconductor wafer is polished, the processing steps in which the front side of the semiconductor wafer is polished causing material removal which does not amount to more than 5 mum in total.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND1TS3JyE9RcMsvUggoyk8pTc7MS1dwVAjIz8kszkhNUQhOzc1Mzs8DSpTkF_EwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDA3MjU0tTY0NHQ2PiVAEAOCoqtw</recordid><startdate>20071108</startdate><enddate>20071108</enddate><creator>STADLER MAXIMILIAN</creator><creator>LANGSDORF KARLHEINZ</creator><creator>SCHWAB GUNTER</creator><creator>FEIJOO DIEGO</creator><scope>EVB</scope></search><sort><creationdate>20071108</creationdate><title>Method For Producing A Polished Semiconductor</title><author>STADLER MAXIMILIAN ; LANGSDORF KARLHEINZ ; SCHWAB GUNTER ; FEIJOO DIEGO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2007259531A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>STADLER MAXIMILIAN</creatorcontrib><creatorcontrib>LANGSDORF KARLHEINZ</creatorcontrib><creatorcontrib>SCHWAB GUNTER</creatorcontrib><creatorcontrib>FEIJOO DIEGO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STADLER MAXIMILIAN</au><au>LANGSDORF KARLHEINZ</au><au>SCHWAB GUNTER</au><au>FEIJOO DIEGO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method For Producing A Polished Semiconductor</title><date>2007-11-08</date><risdate>2007</risdate><abstract>Semiconductor wafers are cut from a crystal and subjected to a series of processing steps in which material is removed from a front side and a rear side of the semiconductor wafers, comprising the following processing steps: a mechanical processing step, an etching step in which the semiconductor wafers are oxidized and material is removed from the front side of the wafers with the aid of a gaseous etchant containing hydrofluoric acid at a temperature of 20 to 70° C., and a polishing step in which the front side of the semiconductor wafer is polished, the processing steps in which the front side of the semiconductor wafer is polished causing material removal which does not amount to more than 5 mum in total.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2007259531A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Method For Producing A Polished Semiconductor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T16%3A24%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STADLER%20MAXIMILIAN&rft.date=2007-11-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2007259531A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true