Method for the Characterisation of Surface Structures and use Thereof for the Modification Development and Production of Materials
A method of characterizing surface structures using a chemically curable impression material to take an impression of at least one site of the undamaged surface of an article and of a surface of an article damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, an...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | UPHOFF HOLGER LODDING BERND STUBBE WILFRIED HERRMANN PETRA |
| description | A method of characterizing surface structures using a chemically curable impression material to take an impression of at least one site of the undamaged surface of an article and of a surface of an article damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, and/or of a surface of a test specimen mounted on the surface of an article, said test specimen surface being damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, curing the impression material to produce a negative of the damage pattern, and using image analysis to determine the extent of the surface structures and/or the extent of the surface damage within the damage pattern on the basis of light-microscope pictures of the negative. Use of the method for the preparation, modification and/or development of new and/or existing materials. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2007217671A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2007217671A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2007217671A13</originalsourceid><addsrcrecordid>eNqNjbEKwjAURbs4iPoPD5yFtoKdpSouBaF1lpC-kEDNKy8vfoBfbtS6O53lnnvm2bNBsdSDIQaxCLVVrLQgu6DEkQcy0EY2SiO0wlFLZAygfA8xIHQWGdPkpzfUO-P0Vz3gAwca7-jlI1yY-nQwvTbqXVFDWGYzk4CriYtsfTp29XmDI90wjCntUW7XtszzqiyqXVXsi-1_qxfg9krN</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for the Characterisation of Surface Structures and use Thereof for the Modification Development and Production of Materials</title><source>esp@cenet</source><creator>UPHOFF HOLGER ; LODDING BERND ; STUBBE WILFRIED ; HERRMANN PETRA</creator><creatorcontrib>UPHOFF HOLGER ; LODDING BERND ; STUBBE WILFRIED ; HERRMANN PETRA</creatorcontrib><description>A method of characterizing surface structures using a chemically curable impression material to take an impression of at least one site of the undamaged surface of an article and of a surface of an article damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, and/or of a surface of a test specimen mounted on the surface of an article, said test specimen surface being damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, curing the impression material to produce a negative of the damage pattern, and using image analysis to determine the extent of the surface structures and/or the extent of the surface damage within the damage pattern on the basis of light-microscope pictures of the negative. Use of the method for the preparation, modification and/or development of new and/or existing materials.</description><language>eng</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070920&DB=EPODOC&CC=US&NR=2007217671A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070920&DB=EPODOC&CC=US&NR=2007217671A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>UPHOFF HOLGER</creatorcontrib><creatorcontrib>LODDING BERND</creatorcontrib><creatorcontrib>STUBBE WILFRIED</creatorcontrib><creatorcontrib>HERRMANN PETRA</creatorcontrib><title>Method for the Characterisation of Surface Structures and use Thereof for the Modification Development and Production of Materials</title><description>A method of characterizing surface structures using a chemically curable impression material to take an impression of at least one site of the undamaged surface of an article and of a surface of an article damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, and/or of a surface of a test specimen mounted on the surface of an article, said test specimen surface being damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, curing the impression material to produce a negative of the damage pattern, and using image analysis to determine the extent of the surface structures and/or the extent of the surface damage within the damage pattern on the basis of light-microscope pictures of the negative. Use of the method for the preparation, modification and/or development of new and/or existing materials.</description><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SCANNING-PROBE TECHNIQUES OR APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjbEKwjAURbs4iPoPD5yFtoKdpSouBaF1lpC-kEDNKy8vfoBfbtS6O53lnnvm2bNBsdSDIQaxCLVVrLQgu6DEkQcy0EY2SiO0wlFLZAygfA8xIHQWGdPkpzfUO-P0Vz3gAwca7-jlI1yY-nQwvTbqXVFDWGYzk4CriYtsfTp29XmDI90wjCntUW7XtszzqiyqXVXsi-1_qxfg9krN</recordid><startdate>20070920</startdate><enddate>20070920</enddate><creator>UPHOFF HOLGER</creator><creator>LODDING BERND</creator><creator>STUBBE WILFRIED</creator><creator>HERRMANN PETRA</creator><scope>EVB</scope></search><sort><creationdate>20070920</creationdate><title>Method for the Characterisation of Surface Structures and use Thereof for the Modification Development and Production of Materials</title><author>UPHOFF HOLGER ; LODDING BERND ; STUBBE WILFRIED ; HERRMANN PETRA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2007217671A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SCANNING-PROBE TECHNIQUES OR APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>UPHOFF HOLGER</creatorcontrib><creatorcontrib>LODDING BERND</creatorcontrib><creatorcontrib>STUBBE WILFRIED</creatorcontrib><creatorcontrib>HERRMANN PETRA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>UPHOFF HOLGER</au><au>LODDING BERND</au><au>STUBBE WILFRIED</au><au>HERRMANN PETRA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for the Characterisation of Surface Structures and use Thereof for the Modification Development and Production of Materials</title><date>2007-09-20</date><risdate>2007</risdate><abstract>A method of characterizing surface structures using a chemically curable impression material to take an impression of at least one site of the undamaged surface of an article and of a surface of an article damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, and/or of a surface of a test specimen mounted on the surface of an article, said test specimen surface being damaged by mechanical and/or chemical exposure and/or by exposure to radiation and/or heat, curing the impression material to produce a negative of the damage pattern, and using image analysis to determine the extent of the surface structures and/or the extent of the surface damage within the damage pattern on the basis of light-microscope pictures of the negative. Use of the method for the preparation, modification and/or development of new and/or existing materials.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2007217671A1 |
| source | esp@cenet |
| subjects | APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING |
| title | Method for the Characterisation of Surface Structures and use Thereof for the Modification Development and Production of Materials |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-15T09%3A24%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=UPHOFF%20HOLGER&rft.date=2007-09-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2007217671A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |