In-situ large area optical strain measurement using an encoded dot pattern

In-situ large area optical strain measurement using an encoded dot pattern

A method of measuring strain in a test specimen comprises the steps of placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, using the sets of coded marks to identify locations of at lea...

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Hauptverfasser: CHRIST ROBERT J.JR, MADSEN JOHN S, PAPAZIAN JOHN M, NARDIELLO JERRELL A
Format: Patent
Sprache:eng
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MEASURING
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE
PHYSICS
TESTING
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creator CHRIST ROBERT J.JR
MADSEN JOHN S
PAPAZIAN JOHN M
NARDIELLO JERRELL A
description A method of measuring strain in a test specimen comprises the steps of placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, using the sets of coded marks to identify locations of at least two of the target marks, and using a change in distance between at least two of the marks to determine strain in the test specimen. An apparatus that performs the method is also provided.
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subjects MEASURING
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE
PHYSICS
TESTING
title In-situ large area optical strain measurement using an encoded dot pattern
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