Laser atom probe methods

A laser atom probe ( 100 ) situates a counter electrode between a specimen mount and a detector ( 106 ), and provides a laser ( 116 ) having its beam ( 122 ) aligned to illuminate the specimen ( 104 ) through the aperture ( 110 ) of the counter electrode ( 108 ). The detector, specimen mount ( 102 )...

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Hauptverfasser:	OLSON JESSE D, BUNTON JOSEPH H
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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creator	OLSON JESSE D BUNTON JOSEPH H
description	A laser atom probe ( 100 ) situates a counter electrode between a specimen mount and a detector ( 106 ), and provides a laser ( 116 ) having its beam ( 122 ) aligned to illuminate the specimen ( 104 ) through the aperture ( 110 ) of the counter electrode ( 108 ). The detector, specimen mount ( 102 ), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
format	Patent
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The detector, specimen mount ( 102 ), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. 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The detector, specimen mount ( 102 ), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. 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The detector, specimen mount ( 102 ), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
title	Laser atom probe methods
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