Dynamic on-chip logic analysis

An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and th...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WHITT JEFFERY K, OLSON STEVE A, BROWEN ADAM S, CHAFIN CRAIG
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NUCLEAR ENGINEERING NUCLEAR PHYSICS NUCLEAR REACTORS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!