Apparatus for the removal of a set of byproducts from a substrate edge and methods therefor

A plasma processing system including a plasma chamber for processing a substrate is disclosed. The apparatus includes a chuck configured for supporting a first surface of the substrate. The apparatus also includes a plasma resistant barrier disposed in a spaced-apart relationship with respect to a s...

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Bibliographische Detailangaben
Hauptverfasser: KIM YUNSANG, BAILEY ANDREW D.III, YOON HYUNGSUK A
Format: Patent
Sprache:eng
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