Two-transistor memory cell and method for manufacturing
The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate s...
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creator | VAN SCHAIJK ROBERTUS THEODORUS F SLOTBOOM MICHIEL |
description | The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate stack. ( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate ( 54 ) is smaller than the floating gate ( 52 ), and spacers ( 81 ) are present next to the control gate ( 54 ). |
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( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate ( 54 ) is smaller than the floating gate ( 52 ), and spacers ( 81 ) are present next to the control gate ( 54 ).</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070215&DB=EPODOC&CC=US&NR=2007034936A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070215&DB=EPODOC&CC=US&NR=2007034936A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VAN SCHAIJK ROBERTUS THEODORUS F</creatorcontrib><creatorcontrib>SLOTBOOM MICHIEL</creatorcontrib><title>Two-transistor memory cell and method for manufacturing</title><description>The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate stack. ( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. 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( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate ( 54 ) is smaller than the floating gate ( 52 ), and spacers ( 81 ) are present next to the control gate ( 54 ).</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Two-transistor memory cell and method for manufacturing |
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