Two-transistor memory cell and method for manufacturing

The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate s...

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Hauptverfasser: VAN SCHAIJK ROBERTUS THEODORUS F, SLOTBOOM MICHIEL
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creator VAN SCHAIJK ROBERTUS THEODORUS F
SLOTBOOM MICHIEL
description The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate stack. ( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate ( 54 ) is smaller than the floating gate ( 52 ), and spacers ( 81 ) are present next to the control gate ( 54 ).
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2007034936A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2007034936A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2007034936A13</originalsourceid><addsrcrecordid>eNrjZDAPKc_XLSlKzCvOLC7JL1LITc3NL6pUSE7NyVFIzEsB8ksy8lMU0kBSiXmlaYnJJaVFmXnpPAysaYk5xam8UJqbQdnNNcTZQze1ID8-tbggMTk1L7UkPjTYyMDA3MDYxNLYzNHQmDhVALc_Lz4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Two-transistor memory cell and method for manufacturing</title><source>esp@cenet</source><creator>VAN SCHAIJK ROBERTUS THEODORUS F ; SLOTBOOM MICHIEL</creator><creatorcontrib>VAN SCHAIJK ROBERTUS THEODORUS F ; SLOTBOOM MICHIEL</creatorcontrib><description>The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate stack. ( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate ( 54 ) is smaller than the floating gate ( 52 ), and spacers ( 81 ) are present next to the control gate ( 54 ).</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20070215&amp;DB=EPODOC&amp;CC=US&amp;NR=2007034936A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20070215&amp;DB=EPODOC&amp;CC=US&amp;NR=2007034936A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VAN SCHAIJK ROBERTUS THEODORUS F</creatorcontrib><creatorcontrib>SLOTBOOM MICHIEL</creatorcontrib><title>Two-transistor memory cell and method for manufacturing</title><description>The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate stack. ( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate ( 54 ) is smaller than the floating gate ( 52 ), and spacers ( 81 ) are present next to the control gate ( 54 ).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAPKc_XLSlKzCvOLC7JL1LITc3NL6pUSE7NyVFIzEsB8ksy8lMU0kBSiXmlaYnJJaVFmXnpPAysaYk5xam8UJqbQdnNNcTZQze1ID8-tbggMTk1L7UkPjTYyMDA3MDYxNLYzNHQmDhVALc_Lz4</recordid><startdate>20070215</startdate><enddate>20070215</enddate><creator>VAN SCHAIJK ROBERTUS THEODORUS F</creator><creator>SLOTBOOM MICHIEL</creator><scope>EVB</scope></search><sort><creationdate>20070215</creationdate><title>Two-transistor memory cell and method for manufacturing</title><author>VAN SCHAIJK ROBERTUS THEODORUS F ; SLOTBOOM MICHIEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2007034936A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>VAN SCHAIJK ROBERTUS THEODORUS F</creatorcontrib><creatorcontrib>SLOTBOOM MICHIEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VAN SCHAIJK ROBERTUS THEODORUS F</au><au>SLOTBOOM MICHIEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Two-transistor memory cell and method for manufacturing</title><date>2007-02-15</date><risdate>2007</risdate><abstract>The present invention provides a method of manufacturing on a substrate ( 50 ) a 2-transistor memory cell comprising a storage transistor ( 1 ) having a memory gate stack ( 1 ) and a selecting transistor, there being a tunnel dielectric layer ( 51 ) between the substrate ( 50 ) and the memory gate stack. ( 1 ). The method comprises forming the memory gate stack ( 1 ) by providing a first conductive layer ( 52 ) and a second conductive layer ( 54 ) and etching the second conductive layer ( 54 ) thus forming a control gate and etching the first conductive layer ( 52 ) thus forming a floating gate. The method is characterized in that it comprises, before etching the first conductive layer ( 52 ), forming spacers ( 81 ) against the control gate in the direction of a channel to be formed under the tunnel dielectric layer ( 51 ), and thereafter using the spacers ( 81 ) as a hard mask to etch the first conductive layer ( 52 ) thus forming the floating gate, thus making the floating gate self aligned with the control gate. The present invention also provides a memory cell wherein the control gate ( 54 ) is smaller than the floating gate ( 52 ), and spacers ( 81 ) are present next to the control gate ( 54 ).</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Two-transistor memory cell and method for manufacturing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T02%3A41%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=VAN%20SCHAIJK%20ROBERTUS%20THEODORUS%20F&rft.date=2007-02-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2007034936A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true