Methods and apparatus for memory calibration

In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of...

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Hauptverfasser:	MCKEVETT BRIAN M, GANFIELD PAUL A, OZGUNER TOLGA
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	MCKEVETT BRIAN M GANFIELD PAUL A OZGUNER TOLGA
description	In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and (2) while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data. Numerous other aspects are provided.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2007027650A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2007027650A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2007027650A13</originalsourceid><addsrcrecordid>eNrjZNDxTS3JyE8pVkjMS1FILChILEosKS1WSMsvUshNzc0vqlRITszJTAKKZubn8TCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMDcwMjczNTA0dDY-JUAQBKUSrh</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and apparatus for memory calibration</title><source>esp@cenet</source><creator>MCKEVETT BRIAN M ; GANFIELD PAUL A ; OZGUNER TOLGA</creator><creatorcontrib>MCKEVETT BRIAN M ; GANFIELD PAUL A ; OZGUNER TOLGA</creatorcontrib><description>In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and (2) while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data. Numerous other aspects are provided.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070201&DB=EPODOC&CC=US&NR=2007027650A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070201&DB=EPODOC&CC=US&NR=2007027650A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MCKEVETT BRIAN M</creatorcontrib><creatorcontrib>GANFIELD PAUL A</creatorcontrib><creatorcontrib>OZGUNER TOLGA</creatorcontrib><title>Methods and apparatus for memory calibration</title><description>In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and (2) while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data. Numerous other aspects are provided.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDxTS3JyE8pVkjMS1FILChILEosKS1WSMsvUshNzc0vqlRITszJTAKKZubn8TCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMDcwMjczNTA0dDY-JUAQBKUSrh</recordid><startdate>20070201</startdate><enddate>20070201</enddate><creator>MCKEVETT BRIAN M</creator><creator>GANFIELD PAUL A</creator><creator>OZGUNER TOLGA</creator><scope>EVB</scope></search><sort><creationdate>20070201</creationdate><title>Methods and apparatus for memory calibration</title><author>MCKEVETT BRIAN M ; GANFIELD PAUL A ; OZGUNER TOLGA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2007027650A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MCKEVETT BRIAN M</creatorcontrib><creatorcontrib>GANFIELD PAUL A</creatorcontrib><creatorcontrib>OZGUNER TOLGA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MCKEVETT BRIAN M</au><au>GANFIELD PAUL A</au><au>OZGUNER TOLGA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and apparatus for memory calibration</title><date>2007-02-01</date><risdate>2007</risdate><abstract>In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and (2) while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data. Numerous other aspects are provided.</abstract><oa>free_for_read</oa></addata></record>
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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	Methods and apparatus for memory calibration
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T04%3A34%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MCKEVETT%20BRIAN%20M&rft.date=2007-02-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2007027650A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true