Structure and method for minimizing substrate effect on nucleation during sputtering of thin film resistors
A method of improving nucleation during depositing of a film ( 2 ) on a surface ( 18 - 3 ) of a wafer, including performing a planarizing operation on the surface ( 18 - 3 ), the planarizing operation resulting in generation of dangling chemical bonding sites on the surface, depositing a dielectric...
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Sprache: | eng |
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