Test sockets, test systems, and methods for testing microfeature devices

Test sockets, test systems, and methods for testing microfeature devices with a substrate and a plurality of conductive interconnect elements projecting from the substrate. In one embodiment, a test socket includes a support surface and a plurality of apertures in the support surface corresponding t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TVERDY MARK A, CALDWELL JOHN L, SLAUGHTER MICHAEL R
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!