Method for detecting lateral surface charge migration through double exposure averaging

Method for detecting lateral surface charge migration through double exposure averaging

The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, th...

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Hauptverfasser: MISHRA SATCHIDANAND, HINCKEL M. J, DOMM EDWARD, SILVESTRI MARKUS R, JEYADEV SURENDAR, MARKOVICS JAMES M
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
CINEMATOGRAPHY
COMPUTING
COUNTING
ELECTROGRAPHY
ELECTROPHOTOGRAPHY
HANDLING RECORD CARRIERS
HOLOGRAPHY
MAGNETOGRAPHY
PHOTOGRAPHY
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
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creator MISHRA SATCHIDANAND
HINCKEL M. J
DOMM EDWARD
SILVESTRI MARKUS R
JEYADEV SURENDAR
MARKOVICS JAMES M
description The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, the surface is exposed a second time to the image. After another waiting period, the average potential is measured. The amount of LCM may be quantified by varying the waiting periods.
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subjects CALCULATING
CINEMATOGRAPHY
COMPUTING
COUNTING
ELECTROGRAPHY
ELECTROPHOTOGRAPHY
HANDLING RECORD CARRIERS
HOLOGRAPHY
MAGNETOGRAPHY
PHOTOGRAPHY
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
title Method for detecting lateral surface charge migration through double exposure averaging
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