Analytical filter

Embodiments of the invention eliminate, in an elemental analysis made of fine particles trapped using a conventional analytical filter, a hindrance to correct identification of elements of the fine particles as an original object of measurement that would otherwise cause the X-ray analyzer to measur...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NAKAGAWA NOBUO, OGUCHI MITSUHIKO, ICHIKAWA KATSUJI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator NAKAGAWA NOBUO
OGUCHI MITSUHIKO
ICHIKAWA KATSUJI
description Embodiments of the invention eliminate, in an elemental analysis made of fine particles trapped using a conventional analytical filter, a hindrance to correct identification of elements of the fine particles as an original object of measurement that would otherwise cause the X-ray analyzer to measure elements of a filter base in addition to those of the fine particles. In one embodiment, an analytical filter includes a filter base and a metallic coating film. The filter base made of a resin has a plurality of filtering holes, each having a hole diameter ranging between about 100 nm and 1000 nm. The metallic coating film is formed on one face of the filter base through ion sputtering of gold (Au). The metallic coating film is so thick that an electron beam from an X-ray analyzer does not penetrate therethrough and the filtering holes are not plugged up. The metallic coating film is at least about 40 nm thick and is preferably about 40 nm to 100 nm thick.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2006081527A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2006081527A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2006081527A13</originalsourceid><addsrcrecordid>eNrjZBB0zEvMqSzJTE7MUUjLzClJLeJhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGBmYGFoamRuaOhsbEqQIAUwMgkg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Analytical filter</title><source>esp@cenet</source><creator>NAKAGAWA NOBUO ; OGUCHI MITSUHIKO ; ICHIKAWA KATSUJI</creator><creatorcontrib>NAKAGAWA NOBUO ; OGUCHI MITSUHIKO ; ICHIKAWA KATSUJI</creatorcontrib><description>Embodiments of the invention eliminate, in an elemental analysis made of fine particles trapped using a conventional analytical filter, a hindrance to correct identification of elements of the fine particles as an original object of measurement that would otherwise cause the X-ray analyzer to measure elements of a filter base in addition to those of the fine particles. In one embodiment, an analytical filter includes a filter base and a metallic coating film. The filter base made of a resin has a plurality of filtering holes, each having a hole diameter ranging between about 100 nm and 1000 nm. The metallic coating film is formed on one face of the filter base through ion sputtering of gold (Au). The metallic coating film is so thick that an electron beam from an X-ray analyzer does not penetrate therethrough and the filtering holes are not plugged up. The metallic coating film is at least about 40 nm thick and is preferably about 40 nm to 100 nm thick.</description><language>eng</language><subject>PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; SEPARATION ; TRANSPORTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060420&amp;DB=EPODOC&amp;CC=US&amp;NR=2006081527A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060420&amp;DB=EPODOC&amp;CC=US&amp;NR=2006081527A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKAGAWA NOBUO</creatorcontrib><creatorcontrib>OGUCHI MITSUHIKO</creatorcontrib><creatorcontrib>ICHIKAWA KATSUJI</creatorcontrib><title>Analytical filter</title><description>Embodiments of the invention eliminate, in an elemental analysis made of fine particles trapped using a conventional analytical filter, a hindrance to correct identification of elements of the fine particles as an original object of measurement that would otherwise cause the X-ray analyzer to measure elements of a filter base in addition to those of the fine particles. In one embodiment, an analytical filter includes a filter base and a metallic coating film. The filter base made of a resin has a plurality of filtering holes, each having a hole diameter ranging between about 100 nm and 1000 nm. The metallic coating film is formed on one face of the filter base through ion sputtering of gold (Au). The metallic coating film is so thick that an electron beam from an X-ray analyzer does not penetrate therethrough and the filtering holes are not plugged up. The metallic coating film is at least about 40 nm thick and is preferably about 40 nm to 100 nm thick.</description><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>SEPARATION</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBB0zEvMqSzJTE7MUUjLzClJLeJhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGBmYGFoamRuaOhsbEqQIAUwMgkg</recordid><startdate>20060420</startdate><enddate>20060420</enddate><creator>NAKAGAWA NOBUO</creator><creator>OGUCHI MITSUHIKO</creator><creator>ICHIKAWA KATSUJI</creator><scope>EVB</scope></search><sort><creationdate>20060420</creationdate><title>Analytical filter</title><author>NAKAGAWA NOBUO ; OGUCHI MITSUHIKO ; ICHIKAWA KATSUJI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2006081527A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>SEPARATION</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKAGAWA NOBUO</creatorcontrib><creatorcontrib>OGUCHI MITSUHIKO</creatorcontrib><creatorcontrib>ICHIKAWA KATSUJI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKAGAWA NOBUO</au><au>OGUCHI MITSUHIKO</au><au>ICHIKAWA KATSUJI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Analytical filter</title><date>2006-04-20</date><risdate>2006</risdate><abstract>Embodiments of the invention eliminate, in an elemental analysis made of fine particles trapped using a conventional analytical filter, a hindrance to correct identification of elements of the fine particles as an original object of measurement that would otherwise cause the X-ray analyzer to measure elements of a filter base in addition to those of the fine particles. In one embodiment, an analytical filter includes a filter base and a metallic coating film. The filter base made of a resin has a plurality of filtering holes, each having a hole diameter ranging between about 100 nm and 1000 nm. The metallic coating film is formed on one face of the filter base through ion sputtering of gold (Au). The metallic coating film is so thick that an electron beam from an X-ray analyzer does not penetrate therethrough and the filtering holes are not plugged up. The metallic coating film is at least about 40 nm thick and is preferably about 40 nm to 100 nm thick.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2006081527A1
source esp@cenet
subjects PERFORMING OPERATIONS
PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
SEPARATION
TRANSPORTING
title Analytical filter
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T11%3A06%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAKAGAWA%20NOBUO&rft.date=2006-04-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2006081527A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true