Time-resolved nonlinear complex sensitivity measuring instrument

A time resolved, nonlinear complex susceptibility measuring apparatus ( 1 ) that is capable of measurement unaffected by any distortion of the wave front of a probe light whereby a temporal change in the nonlinear complex susceptibility of a nonlinear optical material that occurs when it is irradiat...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	INUZUKA FUMIKAZU, LANG HIROYOSHI, MISAWA KAZUHIKO
Format:	Patent
Sprache:	eng
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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