Method and apparatus for generating test signals

Method for the generation of test signals (TS) by means of a test signal generator to a component ( 6 ) to be tested, the test signal generator generating rising and falling signal edges which are in each case assigned to successive time windows (TS 1 -TSN) with predetermined time durations (T 0 ), having the following method steps of: determining a command sequence frequency (BAF) of the component ( 6 ) to be tested; allocating instants (TS 1 U, . . . TSNU) for rising signal edges and allocating instants (TS 1 D . . . TSND) for falling signal edges for the successive time windows (TS 1 -TSN), the instants for the rising or falling signal edges (TS 1 D, . . . TSND, TS 1 U-TSNU) that are allocated to a respective time window being allocated in each case into the time range of the time window if the command sequence frequency (BAF) is lower than a limiting frequency (GF) of the test signal generator, the said limiting frequency being determined by the predetermined time duration (T 0 ), or allocating at least one instant (TS 1 U, . . . TSNU) for a rising signal edge and allocating at least one instant (TS 1 D, . . . TSND) for a falling signal edge for the successive time windows (TS 1 -TSN), at least one allocated instant (TS 1 U, . . . TSND) for a rising or falling signal edge being allocated into a time range of one of the following time windows if the command sequence frequency (BAF) is higher than the limiting frequency (GF) of the test signal generator; generating the test signal (TS) with the respective signal edges at the allocated instants (TS 1 U, . . . TSND) and applying the corresponding test signal (TS) to the component ( 6 ) to be tested.