Metal capacitor stacked with a MOS capacitor to provide increased capacitance density

An on-chip capacitive device comprises a semiconductor substrate, a MOS capacitor formed on the semiconductor substrate, and a metal interconnect capacitor formed at least in part in a region above the MOS capacitor. The MOS capacitor and the metal interconnect capacitor are connected in parallel to...

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Hauptverfasser: VUONG HONG-HA, HE CANZHONG, SCHULER JOHN A, SHARPE JOHN M
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creator VUONG HONG-HA
HE CANZHONG
SCHULER JOHN A
SHARPE JOHN M
description An on-chip capacitive device comprises a semiconductor substrate, a MOS capacitor formed on the semiconductor substrate, and a metal interconnect capacitor formed at least in part in a region above the MOS capacitor. The MOS capacitor and the metal interconnect capacitor are connected in parallel to form a single capacitive device. The capacitance densities of the MOS capacitor and the metal interconnect capacitor are, thereby, combined. Advantageously, significant capacitance density gains can be achieved without additional processing steps.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2006024905A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2006024905A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2006024905A13</originalsourceid><addsrcrecordid>eNrjZAj1TS1JzFFITixITM4syS9SKC5JTM5OTVEozyzJUEhU8PUPRpIsyVcoKMovy0xJVcjMSy5KTSwGqoRKJ-YlpyqkpOYVZ5ZU8jCwpiXmFKfyQmluBmU31xBnD93Ugvz41GKg-tS81JL40GAjAwMzAyMTSwNTR0Nj4lQBAIL0Ocg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Metal capacitor stacked with a MOS capacitor to provide increased capacitance density</title><source>esp@cenet</source><creator>VUONG HONG-HA ; HE CANZHONG ; SCHULER JOHN A ; SHARPE JOHN M</creator><creatorcontrib>VUONG HONG-HA ; HE CANZHONG ; SCHULER JOHN A ; SHARPE JOHN M</creatorcontrib><description>An on-chip capacitive device comprises a semiconductor substrate, a MOS capacitor formed on the semiconductor substrate, and a metal interconnect capacitor formed at least in part in a region above the MOS capacitor. The MOS capacitor and the metal interconnect capacitor are connected in parallel to form a single capacitive device. The capacitance densities of the MOS capacitor and the metal interconnect capacitor are, thereby, combined. Advantageously, significant capacitance density gains can be achieved without additional processing steps.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060202&amp;DB=EPODOC&amp;CC=US&amp;NR=2006024905A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060202&amp;DB=EPODOC&amp;CC=US&amp;NR=2006024905A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VUONG HONG-HA</creatorcontrib><creatorcontrib>HE CANZHONG</creatorcontrib><creatorcontrib>SCHULER JOHN A</creatorcontrib><creatorcontrib>SHARPE JOHN M</creatorcontrib><title>Metal capacitor stacked with a MOS capacitor to provide increased capacitance density</title><description>An on-chip capacitive device comprises a semiconductor substrate, a MOS capacitor formed on the semiconductor substrate, and a metal interconnect capacitor formed at least in part in a region above the MOS capacitor. The MOS capacitor and the metal interconnect capacitor are connected in parallel to form a single capacitive device. The capacitance densities of the MOS capacitor and the metal interconnect capacitor are, thereby, combined. Advantageously, significant capacitance density gains can be achieved without additional processing steps.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAj1TS1JzFFITixITM4syS9SKC5JTM5OTVEozyzJUEhU8PUPRpIsyVcoKMovy0xJVcjMSy5KTSwGqoRKJ-YlpyqkpOYVZ5ZU8jCwpiXmFKfyQmluBmU31xBnD93Ugvz41GKg-tS81JL40GAjAwMzAyMTSwNTR0Nj4lQBAIL0Ocg</recordid><startdate>20060202</startdate><enddate>20060202</enddate><creator>VUONG HONG-HA</creator><creator>HE CANZHONG</creator><creator>SCHULER JOHN A</creator><creator>SHARPE JOHN M</creator><scope>EVB</scope></search><sort><creationdate>20060202</creationdate><title>Metal capacitor stacked with a MOS capacitor to provide increased capacitance density</title><author>VUONG HONG-HA ; HE CANZHONG ; SCHULER JOHN A ; SHARPE JOHN M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2006024905A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>VUONG HONG-HA</creatorcontrib><creatorcontrib>HE CANZHONG</creatorcontrib><creatorcontrib>SCHULER JOHN A</creatorcontrib><creatorcontrib>SHARPE JOHN M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VUONG HONG-HA</au><au>HE CANZHONG</au><au>SCHULER JOHN A</au><au>SHARPE JOHN M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Metal capacitor stacked with a MOS capacitor to provide increased capacitance density</title><date>2006-02-02</date><risdate>2006</risdate><abstract>An on-chip capacitive device comprises a semiconductor substrate, a MOS capacitor formed on the semiconductor substrate, and a metal interconnect capacitor formed at least in part in a region above the MOS capacitor. The MOS capacitor and the metal interconnect capacitor are connected in parallel to form a single capacitive device. The capacitance densities of the MOS capacitor and the metal interconnect capacitor are, thereby, combined. Advantageously, significant capacitance density gains can be achieved without additional processing steps.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Metal capacitor stacked with a MOS capacitor to provide increased capacitance density
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T16%3A31%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=VUONG%20HONG-HA&rft.date=2006-02-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2006024905A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true