System and method for simultaneous 3D height measurements on multiple sides of an object

System and method for simultaneous 3D height measurements on multiple sides of an object

An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The method comprises obtaining at least one image of the regions, by modifying an optical path of at...

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Hauptverfasser: QUIRION BENOIT, CANTIN MICHEL
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Sprache:eng
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MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator QUIRION BENOIT
CANTIN MICHEL
description An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The method comprises obtaining at least one image of the regions, by modifying an optical path of at least one portion of intensity coming from one of the regions, wherein each image comprises the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated to the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2006007450A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2006007450A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2006007450A13</originalsourceid><addsrcrecordid>eNqNzLkKwkAUheE0FqK-wwVrYTQutbhgHwW7MGbOmMhs5N4Uvr0j-ABWB34-zri4V28WeNLBkIe00ZCNPXHnByc6IA5M5ZFadM9WstA89PAIwhQDfVGXHLI3yMXmH4qPFxqZFiOrHWP220kxP5-uh8sCKdbgpBsESH2rVkptldqtN2q_LP9TH29AOvE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for simultaneous 3D height measurements on multiple sides of an object</title><source>esp@cenet</source><creator>QUIRION BENOIT ; CANTIN MICHEL</creator><creatorcontrib>QUIRION BENOIT ; CANTIN MICHEL</creatorcontrib><description>An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The method comprises obtaining at least one image of the regions, by modifying an optical path of at least one portion of intensity coming from one of the regions, wherein each image comprises the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated to the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060112&amp;DB=EPODOC&amp;CC=US&amp;NR=2006007450A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060112&amp;DB=EPODOC&amp;CC=US&amp;NR=2006007450A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>QUIRION BENOIT</creatorcontrib><creatorcontrib>CANTIN MICHEL</creatorcontrib><title>System and method for simultaneous 3D height measurements on multiple sides of an object</title><description>An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The method comprises obtaining at least one image of the regions, by modifying an optical path of at least one portion of intensity coming from one of the regions, wherein each image comprises the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated to the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzLkKwkAUheE0FqK-wwVrYTQutbhgHwW7MGbOmMhs5N4Uvr0j-ABWB34-zri4V28WeNLBkIe00ZCNPXHnByc6IA5M5ZFadM9WstA89PAIwhQDfVGXHLI3yMXmH4qPFxqZFiOrHWP220kxP5-uh8sCKdbgpBsESH2rVkptldqtN2q_LP9TH29AOvE</recordid><startdate>20060112</startdate><enddate>20060112</enddate><creator>QUIRION BENOIT</creator><creator>CANTIN MICHEL</creator><scope>EVB</scope></search><sort><creationdate>20060112</creationdate><title>System and method for simultaneous 3D height measurements on multiple sides of an object</title><author>QUIRION BENOIT ; CANTIN MICHEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2006007450A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>QUIRION BENOIT</creatorcontrib><creatorcontrib>CANTIN MICHEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>QUIRION BENOIT</au><au>CANTIN MICHEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for simultaneous 3D height measurements on multiple sides of an object</title><date>2006-01-12</date><risdate>2006</risdate><abstract>An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The method comprises obtaining at least one image of the regions, by modifying an optical path of at least one portion of intensity coming from one of the regions, wherein each image comprises the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated to the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title System and method for simultaneous 3D height measurements on multiple sides of an object
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T14%3A33%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=QUIRION%20BENOIT&rft.date=2006-01-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2006007450A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true