Device transfer mechanism for a test handler

Device transfer mechanism for a test handler

The invention provides a mechanism for a test handler using for electrical testing of electronic devices. The devices are placed on a platform configured to move semiconductor devices from an onloading position to an offloading position along a predetermined path. A transfer arm with a plurality of...

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Hauptverfasser: SZE CHAK TONG ALBERT, TSUI CHING MAN STANLEY, TSAI PEI WEI, CHOW LAP KEI ERIC
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SZE CHAK TONG ALBERT
TSUI CHING MAN STANLEY
TSAI PEI WEI
CHOW LAP KEI ERIC
description The invention provides a mechanism for a test handler using for electrical testing of electronic devices. The devices are placed on a platform configured to move semiconductor devices from an onloading position to an offloading position along a predetermined path. A transfer arm with a plurality of transfer heads connected to it is located adjacent the path. The transfer heads are configured to pick up and transfer semiconductor devices from the platform to a testing position for testing, and thereafter to transfer the semiconductor devices from the testing position to the platform for offloading.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Device transfer mechanism for a test handler
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