Testing using policy-based processing of test results
A testing technique and apparatus are described for applying a test to a System Under Test (SUT) in one or more configurations of the SUT. The test can generate and store multiple output results that capture the behavior of the SUT in performing the test. Policy analysis logic applies a policy to th...
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creator | STOBIE KEITH B SAHNI SUJAY |
description | A testing technique and apparatus are described for applying a test to a System Under Test (SUT) in one or more configurations of the SUT. The test can generate and store multiple output results that capture the behavior of the SUT in performing the test. Policy analysis logic applies a policy to the output results to generate an output verdict that reaches some conclusion regarding the outcome of the test. That is, the applied policy maps a subset of stored output results (and possibly input parameters) into the output verdict based on specified rules. A tester can apply different policies to investigate different aspects of the SUT's behavior. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2005110806A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2005110806A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2005110806A13</originalsourceid><addsrcrecordid>eNrjZDANSS0uycxLVygtBpEF-TmZyZW6SYnFqSkKBUX5yanFYPH8NIUSoEKFotTi0pySYh4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh8abGRgYGpoaGBhYOZoaEycKgBB9C5i</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing using policy-based processing of test results</title><source>esp@cenet</source><creator>STOBIE KEITH B ; SAHNI SUJAY</creator><creatorcontrib>STOBIE KEITH B ; SAHNI SUJAY</creatorcontrib><description>A testing technique and apparatus are described for applying a test to a System Under Test (SUT) in one or more configurations of the SUT. The test can generate and store multiple output results that capture the behavior of the SUT in performing the test. Policy analysis logic applies a policy to the output results to generate an output verdict that reaches some conclusion regarding the outcome of the test. That is, the applied policy maps a subset of stored output results (and possibly input parameters) into the output verdict based on specified rules. A tester can apply different policies to investigate different aspects of the SUT's behavior.</description><edition>7</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050526&DB=EPODOC&CC=US&NR=2005110806A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050526&DB=EPODOC&CC=US&NR=2005110806A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STOBIE KEITH B</creatorcontrib><creatorcontrib>SAHNI SUJAY</creatorcontrib><title>Testing using policy-based processing of test results</title><description>A testing technique and apparatus are described for applying a test to a System Under Test (SUT) in one or more configurations of the SUT. The test can generate and store multiple output results that capture the behavior of the SUT in performing the test. Policy analysis logic applies a policy to the output results to generate an output verdict that reaches some conclusion regarding the outcome of the test. That is, the applied policy maps a subset of stored output results (and possibly input parameters) into the output verdict based on specified rules. A tester can apply different policies to investigate different aspects of the SUT's behavior.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDANSS0uycxLVygtBpEF-TmZyZW6SYnFqSkKBUX5yanFYPH8NIUSoEKFotTi0pySYh4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh8abGRgYGpoaGBhYOZoaEycKgBB9C5i</recordid><startdate>20050526</startdate><enddate>20050526</enddate><creator>STOBIE KEITH B</creator><creator>SAHNI SUJAY</creator><scope>EVB</scope></search><sort><creationdate>20050526</creationdate><title>Testing using policy-based processing of test results</title><author>STOBIE KEITH B ; SAHNI SUJAY</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2005110806A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>STOBIE KEITH B</creatorcontrib><creatorcontrib>SAHNI SUJAY</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STOBIE KEITH B</au><au>SAHNI SUJAY</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing using policy-based processing of test results</title><date>2005-05-26</date><risdate>2005</risdate><abstract>A testing technique and apparatus are described for applying a test to a System Under Test (SUT) in one or more configurations of the SUT. The test can generate and store multiple output results that capture the behavior of the SUT in performing the test. Policy analysis logic applies a policy to the output results to generate an output verdict that reaches some conclusion regarding the outcome of the test. That is, the applied policy maps a subset of stored output results (and possibly input parameters) into the output verdict based on specified rules. A tester can apply different policies to investigate different aspects of the SUT's behavior.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
title | Testing using policy-based processing of test results |
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