Manipulating micron scale items
Micron scale dielectric items are manipulated by methods and apparatus taking advantage of spatially non-uniform field. Such fields give rise to a force on dielectric items, directing them generally toward regions of more concentrated field. The electrode may be elongated, either unitary, with a gen...
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creator | CIMA MICHAEL J TUPPER MALINDA M CHOPINAUD MARJORIE E |
description | Micron scale dielectric items are manipulated by methods and apparatus taking advantage of spatially non-uniform field. Such fields give rise to a force on dielectric items, directing them generally toward regions of more concentrated field. The electrode may be elongated, either unitary, with a generally planar counter electrode, or dual, such as parallel pins, loops or plates. If dual, particles are generally attracted to regions of high field concentration, including tips, edges and spaces between electrode conductors. Items can be granular, threadlike, or sheets, and microelectronic parts and other shapes. Items can also be collected directly into a recess of a pharmaceutical material delivery microchip, with a conductive membrane of the microchip acting as a manipulating electrode. Items are attracted without regard to their surface charge, or the polarity of the field, which can be AC or DC. Charging, or knowing the charge of items to be manipulated is not necessary. The amount of material collected can be precisely controlled by varying parameters of collection, such as distance between the electrode and the items, distance between dual conductors, size (diameter, length) of the conductors, any dielectric sheathing thereof, and voltage. Elongated electrodes can be used to manipulate items into and from recesses, such as wells of microtitre trays, microchips, and semiconductor chips. Several recesses can be used to calibrate an array of collecting and depositing electrodes and deposits. Items can be removed from fluids, such as aerosol dispersions, and an air cleaner is also disclosed. Dielectrophoretic forces are exploited. Techniques and apparatus for depositing such items include charged targets and targets with electrodes designed to create a non-uniform field. |
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Such fields give rise to a force on dielectric items, directing them generally toward regions of more concentrated field. The electrode may be elongated, either unitary, with a generally planar counter electrode, or dual, such as parallel pins, loops or plates. If dual, particles are generally attracted to regions of high field concentration, including tips, edges and spaces between electrode conductors. Items can be granular, threadlike, or sheets, and microelectronic parts and other shapes. Items can also be collected directly into a recess of a pharmaceutical material delivery microchip, with a conductive membrane of the microchip acting as a manipulating electrode. Items are attracted without regard to their surface charge, or the polarity of the field, which can be AC or DC. Charging, or knowing the charge of items to be manipulated is not necessary. The amount of material collected can be precisely controlled by varying parameters of collection, such as distance between the electrode and the items, distance between dual conductors, size (diameter, length) of the conductors, any dielectric sheathing thereof, and voltage. Elongated electrodes can be used to manipulate items into and from recesses, such as wells of microtitre trays, microchips, and semiconductor chips. Several recesses can be used to calibrate an array of collecting and depositing electrodes and deposits. Items can be removed from fluids, such as aerosol dispersions, and an air cleaner is also disclosed. Dielectrophoretic forces are exploited. Techniques and apparatus for depositing such items include charged targets and targets with electrodes designed to create a non-uniform field.</description><edition>7</edition><language>eng</language><subject>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE ; CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOIDCHEMISTRY ; CHEMISTRY ; COMBINATORIAL CHEMISTRY ; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC ; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES ; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS ; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROMSOLID MATERIALS OR FLUIDS ; MEASURING ; METALLURGY ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PHYSICS ; SEPARATION ; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS ; SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS ; TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION ; TECHNICAL SUBJECTS COVERED BY FORMER USPC ; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS ; TESTING ; THEIR RELEVANT APPARATUS ; TRANSPORTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041223&DB=EPODOC&CC=US&NR=2004259377A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041223&DB=EPODOC&CC=US&NR=2004259377A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CIMA MICHAEL J</creatorcontrib><creatorcontrib>TUPPER MALINDA M</creatorcontrib><creatorcontrib>CHOPINAUD MARJORIE E</creatorcontrib><title>Manipulating micron scale items</title><description>Micron scale dielectric items are manipulated by methods and apparatus taking advantage of spatially non-uniform field. Such fields give rise to a force on dielectric items, directing them generally toward regions of more concentrated field. The electrode may be elongated, either unitary, with a generally planar counter electrode, or dual, such as parallel pins, loops or plates. If dual, particles are generally attracted to regions of high field concentration, including tips, edges and spaces between electrode conductors. Items can be granular, threadlike, or sheets, and microelectronic parts and other shapes. Items can also be collected directly into a recess of a pharmaceutical material delivery microchip, with a conductive membrane of the microchip acting as a manipulating electrode. Items are attracted without regard to their surface charge, or the polarity of the field, which can be AC or DC. Charging, or knowing the charge of items to be manipulated is not necessary. The amount of material collected can be precisely controlled by varying parameters of collection, such as distance between the electrode and the items, distance between dual conductors, size (diameter, length) of the conductors, any dielectric sheathing thereof, and voltage. Elongated electrodes can be used to manipulate items into and from recesses, such as wells of microtitre trays, microchips, and semiconductor chips. Several recesses can be used to calibrate an array of collecting and depositing electrodes and deposits. Items can be removed from fluids, such as aerosol dispersions, and an air cleaner is also disclosed. Dielectrophoretic forces are exploited. Techniques and apparatus for depositing such items include charged targets and targets with electrodes designed to create a non-uniform field.</description><subject>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</subject><subject>CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOIDCHEMISTRY</subject><subject>CHEMISTRY</subject><subject>COMBINATORIAL CHEMISTRY</subject><subject>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</subject><subject>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES</subject><subject>MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS</subject><subject>MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROMSOLID MATERIALS OR FLUIDS</subject><subject>MEASURING</subject><subject>METALLURGY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PHYSICS</subject><subject>SEPARATION</subject><subject>SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS</subject><subject>SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><subject>TESTING</subject><subject>THEIR RELEVANT APPARATUS</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD3TczLLCjNSSzJzEtXyM1MLsrPUyhOTsxJVcgsSc0t5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgYGJkamlsbm5o6GxsSpAgDMlyYD</recordid><startdate>20041223</startdate><enddate>20041223</enddate><creator>CIMA MICHAEL J</creator><creator>TUPPER MALINDA M</creator><creator>CHOPINAUD MARJORIE E</creator><scope>EVB</scope></search><sort><creationdate>20041223</creationdate><title>Manipulating micron scale items</title><author>CIMA MICHAEL J ; TUPPER MALINDA M ; CHOPINAUD MARJORIE E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2004259377A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</topic><topic>CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOIDCHEMISTRY</topic><topic>CHEMISTRY</topic><topic>COMBINATORIAL CHEMISTRY</topic><topic>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</topic><topic>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES</topic><topic>MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS</topic><topic>MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROMSOLID MATERIALS OR FLUIDS</topic><topic>MEASURING</topic><topic>METALLURGY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PHYSICS</topic><topic>SEPARATION</topic><topic>SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS</topic><topic>SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</topic><topic>TESTING</topic><topic>THEIR RELEVANT APPARATUS</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CIMA MICHAEL J</creatorcontrib><creatorcontrib>TUPPER MALINDA M</creatorcontrib><creatorcontrib>CHOPINAUD MARJORIE E</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CIMA MICHAEL J</au><au>TUPPER MALINDA M</au><au>CHOPINAUD MARJORIE E</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Manipulating micron scale items</title><date>2004-12-23</date><risdate>2004</risdate><abstract>Micron scale dielectric items are manipulated by methods and apparatus taking advantage of spatially non-uniform field. Such fields give rise to a force on dielectric items, directing them generally toward regions of more concentrated field. The electrode may be elongated, either unitary, with a generally planar counter electrode, or dual, such as parallel pins, loops or plates. If dual, particles are generally attracted to regions of high field concentration, including tips, edges and spaces between electrode conductors. Items can be granular, threadlike, or sheets, and microelectronic parts and other shapes. Items can also be collected directly into a recess of a pharmaceutical material delivery microchip, with a conductive membrane of the microchip acting as a manipulating electrode. Items are attracted without regard to their surface charge, or the polarity of the field, which can be AC or DC. Charging, or knowing the charge of items to be manipulated is not necessary. The amount of material collected can be precisely controlled by varying parameters of collection, such as distance between the electrode and the items, distance between dual conductors, size (diameter, length) of the conductors, any dielectric sheathing thereof, and voltage. Elongated electrodes can be used to manipulate items into and from recesses, such as wells of microtitre trays, microchips, and semiconductor chips. Several recesses can be used to calibrate an array of collecting and depositing electrodes and deposits. Items can be removed from fluids, such as aerosol dispersions, and an air cleaner is also disclosed. Dielectrophoretic forces are exploited. Techniques and apparatus for depositing such items include charged targets and targets with electrodes designed to create a non-uniform field.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOIDCHEMISTRY CHEMISTRY COMBINATORIAL CHEMISTRY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROMSOLID MATERIALS OR FLUIDS MEASURING METALLURGY PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS SEPARATION SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING THEIR RELEVANT APPARATUS TRANSPORTING |
title | Manipulating micron scale items |
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