Manipulating micron scale items

Micron scale dielectric items are manipulated by methods and apparatus taking advantage of spatially non-uniform field. Such fields give rise to a force on dielectric items, directing them generally toward regions of more concentrated field. The electrode may be elongated, either unitary, with a gen...

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Hauptverfasser: CIMA MICHAEL J, TUPPER MALINDA M, CHOPINAUD MARJORIE E
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creator CIMA MICHAEL J
TUPPER MALINDA M
CHOPINAUD MARJORIE E
description Micron scale dielectric items are manipulated by methods and apparatus taking advantage of spatially non-uniform field. Such fields give rise to a force on dielectric items, directing them generally toward regions of more concentrated field. The electrode may be elongated, either unitary, with a generally planar counter electrode, or dual, such as parallel pins, loops or plates. If dual, particles are generally attracted to regions of high field concentration, including tips, edges and spaces between electrode conductors. Items can be granular, threadlike, or sheets, and microelectronic parts and other shapes. Items can also be collected directly into a recess of a pharmaceutical material delivery microchip, with a conductive membrane of the microchip acting as a manipulating electrode. Items are attracted without regard to their surface charge, or the polarity of the field, which can be AC or DC. Charging, or knowing the charge of items to be manipulated is not necessary. The amount of material collected can be precisely controlled by varying parameters of collection, such as distance between the electrode and the items, distance between dual conductors, size (diameter, length) of the conductors, any dielectric sheathing thereof, and voltage. Elongated electrodes can be used to manipulate items into and from recesses, such as wells of microtitre trays, microchips, and semiconductor chips. Several recesses can be used to calibrate an array of collecting and depositing electrodes and deposits. Items can be removed from fluids, such as aerosol dispersions, and an air cleaner is also disclosed. Dielectrophoretic forces are exploited. Techniques and apparatus for depositing such items include charged targets and targets with electrodes designed to create a non-uniform field.
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The amount of material collected can be precisely controlled by varying parameters of collection, such as distance between the electrode and the items, distance between dual conductors, size (diameter, length) of the conductors, any dielectric sheathing thereof, and voltage. Elongated electrodes can be used to manipulate items into and from recesses, such as wells of microtitre trays, microchips, and semiconductor chips. Several recesses can be used to calibrate an array of collecting and depositing electrodes and deposits. Items can be removed from fluids, such as aerosol dispersions, and an air cleaner is also disclosed. Dielectrophoretic forces are exploited. 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The amount of material collected can be precisely controlled by varying parameters of collection, such as distance between the electrode and the items, distance between dual conductors, size (diameter, length) of the conductors, any dielectric sheathing thereof, and voltage. Elongated electrodes can be used to manipulate items into and from recesses, such as wells of microtitre trays, microchips, and semiconductor chips. Several recesses can be used to calibrate an array of collecting and depositing electrodes and deposits. Items can be removed from fluids, such as aerosol dispersions, and an air cleaner is also disclosed. Dielectrophoretic forces are exploited. Techniques and apparatus for depositing such items include charged targets and targets with electrodes designed to create a non-uniform field.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOIDCHEMISTRY
CHEMISTRY
COMBINATORIAL CHEMISTRY
GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES
MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS
MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROMSOLID MATERIALS OR FLUIDS
MEASURING
METALLURGY
PERFORMING OPERATIONS
PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
PHYSICS
SEPARATION
SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS
TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
TECHNICAL SUBJECTS COVERED BY FORMER USPC
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
TESTING
THEIR RELEVANT APPARATUS
TRANSPORTING
title Manipulating micron scale items
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