Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data
A population of data points each having three or more parameters associated therewith, such as multi-channel defect data from an optical scanner, are plotted in three dimensions, and groupings of data points are identified. Boundary surfaces are defined in the three-dimensional space for delineating...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | ZENG YU AKUTSU JAMES S SALTER ROBERT J TIEMEYER TIMOTHY R |
description | A population of data points each having three or more parameters associated therewith, such as multi-channel defect data from an optical scanner, are plotted in three dimensions, and groupings of data points are identified. Boundary surfaces are defined in the three-dimensional space for delineating groupings of data points. The different groupings correspond to different data classifications or types. Classification algorithms based on the boundary surfaces are defined. When applied to defect classification, the algorithms can be exported to an optical scanner for runtime classification of defects. An algorithm for identifying a particular grouping of data points can be defined as a Boolean combination of grouping rules from two or more different n-dimensional representations, where n can be either 2 or 3 for each representation. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2004258295A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2004258295A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2004258295A13</originalsourceid><addsrcrecordid>eNqNzTELwjAQBeAuDqL-hwPnQq0KOoooLk7qXM7k0gbSJOQuQ3d_uFb8AU6P9_jgTYvXlaQLGtBr4IGFejAhgXLIbM1gfQuaDClhCErllMYFBRA4J4OKIJhvebIkFILMo2gTxs4qdJAoJmLygmKDH3WfndhSdeg9OdAoOC8mBh3T4pezYnk-3Y-XkmJoiOPnxpM0j1tdVZt6u6v328Nq_Z96A9HuTAU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data</title><source>esp@cenet</source><creator>ZENG YU ; AKUTSU JAMES S ; SALTER ROBERT J ; TIEMEYER TIMOTHY R</creator><creatorcontrib>ZENG YU ; AKUTSU JAMES S ; SALTER ROBERT J ; TIEMEYER TIMOTHY R</creatorcontrib><description>A population of data points each having three or more parameters associated therewith, such as multi-channel defect data from an optical scanner, are plotted in three dimensions, and groupings of data points are identified. Boundary surfaces are defined in the three-dimensional space for delineating groupings of data points. The different groupings correspond to different data classifications or types. Classification algorithms based on the boundary surfaces are defined. When applied to defect classification, the algorithms can be exported to an optical scanner for runtime classification of defects. An algorithm for identifying a particular grouping of data points can be defined as a Boolean combination of grouping rules from two or more different n-dimensional representations, where n can be either 2 or 3 for each representation.</description><edition>7</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041223&DB=EPODOC&CC=US&NR=2004258295A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041223&DB=EPODOC&CC=US&NR=2004258295A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZENG YU</creatorcontrib><creatorcontrib>AKUTSU JAMES S</creatorcontrib><creatorcontrib>SALTER ROBERT J</creatorcontrib><creatorcontrib>TIEMEYER TIMOTHY R</creatorcontrib><title>Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data</title><description>A population of data points each having three or more parameters associated therewith, such as multi-channel defect data from an optical scanner, are plotted in three dimensions, and groupings of data points are identified. Boundary surfaces are defined in the three-dimensional space for delineating groupings of data points. The different groupings correspond to different data classifications or types. Classification algorithms based on the boundary surfaces are defined. When applied to defect classification, the algorithms can be exported to an optical scanner for runtime classification of defects. An algorithm for identifying a particular grouping of data points can be defined as a Boolean combination of grouping rules from two or more different n-dimensional representations, where n can be either 2 or 3 for each representation.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzTELwjAQBeAuDqL-hwPnQq0KOoooLk7qXM7k0gbSJOQuQ3d_uFb8AU6P9_jgTYvXlaQLGtBr4IGFejAhgXLIbM1gfQuaDClhCErllMYFBRA4J4OKIJhvebIkFILMo2gTxs4qdJAoJmLygmKDH3WfndhSdeg9OdAoOC8mBh3T4pezYnk-3Y-XkmJoiOPnxpM0j1tdVZt6u6v328Nq_Z96A9HuTAU</recordid><startdate>20041223</startdate><enddate>20041223</enddate><creator>ZENG YU</creator><creator>AKUTSU JAMES S</creator><creator>SALTER ROBERT J</creator><creator>TIEMEYER TIMOTHY R</creator><scope>EVB</scope></search><sort><creationdate>20041223</creationdate><title>Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data</title><author>ZENG YU ; AKUTSU JAMES S ; SALTER ROBERT J ; TIEMEYER TIMOTHY R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2004258295A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZENG YU</creatorcontrib><creatorcontrib>AKUTSU JAMES S</creatorcontrib><creatorcontrib>SALTER ROBERT J</creatorcontrib><creatorcontrib>TIEMEYER TIMOTHY R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZENG YU</au><au>AKUTSU JAMES S</au><au>SALTER ROBERT J</au><au>TIEMEYER TIMOTHY R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data</title><date>2004-12-23</date><risdate>2004</risdate><abstract>A population of data points each having three or more parameters associated therewith, such as multi-channel defect data from an optical scanner, are plotted in three dimensions, and groupings of data points are identified. Boundary surfaces are defined in the three-dimensional space for delineating groupings of data points. The different groupings correspond to different data classifications or types. Classification algorithms based on the boundary surfaces are defined. When applied to defect classification, the algorithms can be exported to an optical scanner for runtime classification of defects. An algorithm for identifying a particular grouping of data points can be defined as a Boolean combination of grouping rules from two or more different n-dimensional representations, where n can be either 2 or 3 for each representation.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2004258295A1 |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel data |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T22%3A33%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZENG%20YU&rft.date=2004-12-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2004258295A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |