Device and method for analyzing a materials library

A device for analyzing a materials library includes at least one radiation source for electromagnetic radiation, which is positioned in front of the materials library, and at least two flat detectors operating in parallel, which are operable using high-sensitivity resolution and of which one is sens...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SCHEYING GERD, KATZENBERGER STEFFEN, BRINZ THOMAS, JOCKEL JOERG
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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