Method for adaptively testing integrated circuits based on parametric fabrication data
A method of adaptively testing electronic circuits based on fabrication data includes steps for receiving as input fabrication data of the electronic circuits from at least one of electrical test and in-line inspection; calculating a process capability from the fabrication data; and selecting a test...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method of adaptively testing electronic circuits based on fabrication data includes steps for receiving as input fabrication data of the electronic circuits from at least one of electrical test and in-line inspection; calculating a process capability from the fabrication data; and selecting a test selection program based on the process capability to minimize testing cost and to verify performance specifications. |
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