Method and apparatus of stress relief in semiconductor structures
A method, apparatus and system are provided for relieving stress in the via structures of semiconductor structures whenever a linewidth below a via is larger than a ground-rule, including providing a via at least as large as the groundrule, providing a landing pad above the via, providing a via bar...
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creator | HIERLEMANN MATTHIAS KALTALIOGLU ERDEM HOINKIS MARK FRIESE GERALD WARNER DENNIS J COWLEY ANDY |
description | A method, apparatus and system are provided for relieving stress in the via structures of semiconductor structures whenever a linewidth below a via is larger than a ground-rule, including providing a via at least as large as the groundrule, providing a landing pad above the via, providing a via bar in place of a via, slotting the metal linewidth below the via, or providing an oversize via with a sidewall spacer. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2004227214A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2004227214A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2004227214A13</originalsourceid><addsrcrecordid>eNrjZHD0TS3JyE9RSMwD4oKCxKLEktJihfw0heKSotTiYoWi1JzM1DSFzDyF4tTczOT8vJTS5JL8IpA0kFEKVMPDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-JDg40MDEyMjMyNDE0cDY2JUwUA_FEzGw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and apparatus of stress relief in semiconductor structures</title><source>esp@cenet</source><creator>HIERLEMANN MATTHIAS ; KALTALIOGLU ERDEM ; HOINKIS MARK ; FRIESE GERALD ; WARNER DENNIS J ; COWLEY ANDY</creator><creatorcontrib>HIERLEMANN MATTHIAS ; KALTALIOGLU ERDEM ; HOINKIS MARK ; FRIESE GERALD ; WARNER DENNIS J ; COWLEY ANDY</creatorcontrib><description>A method, apparatus and system are provided for relieving stress in the via structures of semiconductor structures whenever a linewidth below a via is larger than a ground-rule, including providing a via at least as large as the groundrule, providing a landing pad above the via, providing a via bar in place of a via, slotting the metal linewidth below the via, or providing an oversize via with a sidewall spacer.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041118&DB=EPODOC&CC=US&NR=2004227214A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041118&DB=EPODOC&CC=US&NR=2004227214A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIERLEMANN MATTHIAS</creatorcontrib><creatorcontrib>KALTALIOGLU ERDEM</creatorcontrib><creatorcontrib>HOINKIS MARK</creatorcontrib><creatorcontrib>FRIESE GERALD</creatorcontrib><creatorcontrib>WARNER DENNIS J</creatorcontrib><creatorcontrib>COWLEY ANDY</creatorcontrib><title>Method and apparatus of stress relief in semiconductor structures</title><description>A method, apparatus and system are provided for relieving stress in the via structures of semiconductor structures whenever a linewidth below a via is larger than a ground-rule, including providing a via at least as large as the groundrule, providing a landing pad above the via, providing a via bar in place of a via, slotting the metal linewidth below the via, or providing an oversize via with a sidewall spacer.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD0TS3JyE9RSMwD4oKCxKLEktJihfw0heKSotTiYoWi1JzM1DSFzDyF4tTczOT8vJTS5JL8IpA0kFEKVMPDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-JDg40MDEyMjMyNDE0cDY2JUwUA_FEzGw</recordid><startdate>20041118</startdate><enddate>20041118</enddate><creator>HIERLEMANN MATTHIAS</creator><creator>KALTALIOGLU ERDEM</creator><creator>HOINKIS MARK</creator><creator>FRIESE GERALD</creator><creator>WARNER DENNIS J</creator><creator>COWLEY ANDY</creator><scope>EVB</scope></search><sort><creationdate>20041118</creationdate><title>Method and apparatus of stress relief in semiconductor structures</title><author>HIERLEMANN MATTHIAS ; KALTALIOGLU ERDEM ; HOINKIS MARK ; FRIESE GERALD ; WARNER DENNIS J ; COWLEY ANDY</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2004227214A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HIERLEMANN MATTHIAS</creatorcontrib><creatorcontrib>KALTALIOGLU ERDEM</creatorcontrib><creatorcontrib>HOINKIS MARK</creatorcontrib><creatorcontrib>FRIESE GERALD</creatorcontrib><creatorcontrib>WARNER DENNIS J</creatorcontrib><creatorcontrib>COWLEY ANDY</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIERLEMANN MATTHIAS</au><au>KALTALIOGLU ERDEM</au><au>HOINKIS MARK</au><au>FRIESE GERALD</au><au>WARNER DENNIS J</au><au>COWLEY ANDY</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus of stress relief in semiconductor structures</title><date>2004-11-18</date><risdate>2004</risdate><abstract>A method, apparatus and system are provided for relieving stress in the via structures of semiconductor structures whenever a linewidth below a via is larger than a ground-rule, including providing a via at least as large as the groundrule, providing a landing pad above the via, providing a via bar in place of a via, slotting the metal linewidth below the via, or providing an oversize via with a sidewall spacer.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Method and apparatus of stress relief in semiconductor structures |
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