Polarization dependent return loss measurement

The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	PADUCH ALEXANDRE
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	PADUCH ALEXANDRE
description	The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2004196449A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2004196449A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2004196449A13</originalsourceid><addsrcrecordid>eNrjZNALyM9JLMqsSizJzM9TSEktSM1LSc0rUShKLSktylPIyS8uVshNTSwuLUrNBYrzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAwMTQ0szExNLR0Nj4lQBAP9NLFE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Polarization dependent return loss measurement</title><source>esp@cenet</source><creator>PADUCH ALEXANDRE</creator><creatorcontrib>PADUCH ALEXANDRE</creatorcontrib><description>The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.</description><edition>7</edition><language>eng</language><subject>MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041007&DB=EPODOC&CC=US&NR=2004196449A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041007&DB=EPODOC&CC=US&NR=2004196449A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PADUCH ALEXANDRE</creatorcontrib><title>Polarization dependent return loss measurement</title><description>The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.</description><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNALyM9JLMqsSizJzM9TSEktSM1LSc0rUShKLSktylPIyS8uVshNTSwuLUrNBYrzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAwMTQ0szExNLR0Nj4lQBAP9NLFE</recordid><startdate>20041007</startdate><enddate>20041007</enddate><creator>PADUCH ALEXANDRE</creator><scope>EVB</scope></search><sort><creationdate>20041007</creationdate><title>Polarization dependent return loss measurement</title><author>PADUCH ALEXANDRE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2004196449A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>PADUCH ALEXANDRE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PADUCH ALEXANDRE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Polarization dependent return loss measurement</title><date>2004-10-07</date><risdate>2004</risdate><abstract>The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng
recordid	cdi_epo_espacenet_US2004196449A1
source	esp@cenet
subjects	MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title	Polarization dependent return loss measurement
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T04%3A47%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=PADUCH%20ALEXANDRE&rft.date=2004-10-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2004196449A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true