Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system
A method and an apparatus are provided for isolating faulty semiconductor devices in a multiple stream graphics system. The apparatus includes a buffer adapted to receive a plurality of data streams. The apparatus further includes a convolver comprising at least one convolution signature register; a...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | NAEGLE NATHANIEL D CHEUNG TYVIS C |
description | A method and an apparatus are provided for isolating faulty semiconductor devices in a multiple stream graphics system. The apparatus includes a buffer adapted to receive a plurality of data streams. The apparatus further includes a convolver comprising at least one convolution signature register; a router adapted to route the data streams from the buffer to the convolver, wherein the router comprises at least one router signature register; and an analyzer adapted to access the convolution and router signature registers, wherein the analyzer is capable of isolating at least one of a faulty semiconductor device and a faulty interconnection using the contents of the convolution and router signature registers. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2004073857A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2004073857A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2004073857A13</originalsourceid><addsrcrecordid>eNqNirsKwkAQANNYiPoPC9ZCNErSiig2VmodlrtNsnAvbjdC_t4UfoDFMMXMsrAP0iFawDCTEmbUUaCLGViiQ-XQQ4ej0wmEPJsY7Gh0zpY-bEiAAyD4eeDkCEQzoYc-YxrYCMgkSn5dLDp0QpufV8X2dn1d7jtKsSVJaCiQtu_noSyPZV01p_q8r_67vjMcQHo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system</title><source>esp@cenet</source><creator>NAEGLE NATHANIEL D ; CHEUNG TYVIS C</creator><creatorcontrib>NAEGLE NATHANIEL D ; CHEUNG TYVIS C</creatorcontrib><description>A method and an apparatus are provided for isolating faulty semiconductor devices in a multiple stream graphics system. The apparatus includes a buffer adapted to receive a plurality of data streams. The apparatus further includes a convolver comprising at least one convolution signature register; a router adapted to route the data streams from the buffer to the convolver, wherein the router comprises at least one router signature register; and an analyzer adapted to access the convolution and router signature registers, wherein the analyzer is capable of isolating at least one of a faulty semiconductor device and a faulty interconnection using the contents of the convolution and router signature registers.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CALCULATING ; CODE CONVERSION IN GENERAL ; CODING ; COMPUTING ; COUNTING ; DECODING ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SIGNALLING ; TESTING ; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION ; TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040415&DB=EPODOC&CC=US&NR=2004073857A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040415&DB=EPODOC&CC=US&NR=2004073857A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAEGLE NATHANIEL D</creatorcontrib><creatorcontrib>CHEUNG TYVIS C</creatorcontrib><title>Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system</title><description>A method and an apparatus are provided for isolating faulty semiconductor devices in a multiple stream graphics system. The apparatus includes a buffer adapted to receive a plurality of data streams. The apparatus further includes a convolver comprising at least one convolution signature register; a router adapted to route the data streams from the buffer to the convolver, wherein the router comprises at least one router signature register; and an analyzer adapted to access the convolution and router signature registers, wherein the analyzer is capable of isolating at least one of a faulty semiconductor device and a faulty interconnection using the contents of the convolution and router signature registers.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CALCULATING</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DECODING</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SIGNALLING</subject><subject>TESTING</subject><subject>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><subject>TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirsKwkAQANNYiPoPC9ZCNErSiig2VmodlrtNsnAvbjdC_t4UfoDFMMXMsrAP0iFawDCTEmbUUaCLGViiQ-XQQ4ej0wmEPJsY7Gh0zpY-bEiAAyD4eeDkCEQzoYc-YxrYCMgkSn5dLDp0QpufV8X2dn1d7jtKsSVJaCiQtu_noSyPZV01p_q8r_67vjMcQHo</recordid><startdate>20040415</startdate><enddate>20040415</enddate><creator>NAEGLE NATHANIEL D</creator><creator>CHEUNG TYVIS C</creator><scope>EVB</scope></search><sort><creationdate>20040415</creationdate><title>Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system</title><author>NAEGLE NATHANIEL D ; CHEUNG TYVIS C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2004073857A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CALCULATING</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DECODING</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SIGNALLING</topic><topic>TESTING</topic><topic>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</topic><topic>TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS</topic><toplevel>online_resources</toplevel><creatorcontrib>NAEGLE NATHANIEL D</creatorcontrib><creatorcontrib>CHEUNG TYVIS C</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAEGLE NATHANIEL D</au><au>CHEUNG TYVIS C</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system</title><date>2004-04-15</date><risdate>2004</risdate><abstract>A method and an apparatus are provided for isolating faulty semiconductor devices in a multiple stream graphics system. The apparatus includes a buffer adapted to receive a plurality of data streams. The apparatus further includes a convolver comprising at least one convolution signature register; a router adapted to route the data streams from the buffer to the convolver, wherein the router comprises at least one router signature register; and an analyzer adapted to access the convolution and router signature registers, wherein the analyzer is capable of isolating at least one of a faulty semiconductor device and a faulty interconnection using the contents of the convolution and router signature registers.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2004073857A1 |
source | esp@cenet |
subjects | BASIC ELECTRONIC CIRCUITRY CALCULATING CODE CONVERSION IN GENERAL CODING COMPUTING COUNTING DECODING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SIGNALLING TESTING TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS |
title | Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T18%3A31%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAEGLE%20NATHANIEL%20D&rft.date=2004-04-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2004073857A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |