Simultaneous display of data gathered using multiple data gathering mechanisms
Waveforms of input/output signals for a device under test (DUT) are simultaneously displayed. A user is presented with an interface that allows the user to specify different modes for capturing data for different input/output signals for the DUT. Data for the different input/output signals are captu...
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creator | JORDAN STEPHEN DENNIS KRECH ALAN S SHEN HSIU-HUAN |
description | Waveforms of input/output signals for a device under test (DUT) are simultaneously displayed. A user is presented with an interface that allows the user to specify different modes for capturing data for different input/output signals for the DUT. Data for the different input/output signals are captured in accordance with different data capturing mechanisms dependent upon the different modes specified by the user. Based on the data, waveforms for each of the different input/output signals are simultaneously displayed. |
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A user is presented with an interface that allows the user to specify different modes for capturing data for different input/output signals for the DUT. Data for the different input/output signals are captured in accordance with different data capturing mechanisms dependent upon the different modes specified by the user. Based on the data, waveforms for each of the different input/output signals are simultaneously displayed.</description><edition>7</edition><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040129&DB=EPODOC&CC=US&NR=2004017184A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040129&DB=EPODOC&CC=US&NR=2004017184A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JORDAN STEPHEN DENNIS</creatorcontrib><creatorcontrib>KRECH ALAN S</creatorcontrib><creatorcontrib>SHEN HSIU-HUAN</creatorcontrib><title>Simultaneous display of data gathered using multiple data gathering mechanisms</title><description>Waveforms of input/output signals for a device under test (DUT) are simultaneously displayed. A user is presented with an interface that allows the user to specify different modes for capturing data for different input/output signals for the DUT. Data for the different input/output signals are captured in accordance with different data capturing mechanisms dependent upon the different modes specified by the user. Based on the data, waveforms for each of the different input/output signals are simultaneously displayed.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPALzswtzSlJzEvNLy1WSMksLshJrFTIT1NISSxJVEhPLMlILUpNUSgtzsxLVwCpzCzISUWWBIunJmck5mUW5xbzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAwMTA0NzQwsTR0Nj4lQBADlZN_4</recordid><startdate>20040129</startdate><enddate>20040129</enddate><creator>JORDAN STEPHEN DENNIS</creator><creator>KRECH ALAN S</creator><creator>SHEN HSIU-HUAN</creator><scope>EVB</scope></search><sort><creationdate>20040129</creationdate><title>Simultaneous display of data gathered using multiple data gathering mechanisms</title><author>JORDAN STEPHEN DENNIS ; KRECH ALAN S ; SHEN HSIU-HUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2004017184A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JORDAN STEPHEN DENNIS</creatorcontrib><creatorcontrib>KRECH ALAN S</creatorcontrib><creatorcontrib>SHEN HSIU-HUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JORDAN STEPHEN DENNIS</au><au>KRECH ALAN S</au><au>SHEN HSIU-HUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Simultaneous display of data gathered using multiple data gathering mechanisms</title><date>2004-01-29</date><risdate>2004</risdate><abstract>Waveforms of input/output signals for a device under test (DUT) are simultaneously displayed. A user is presented with an interface that allows the user to specify different modes for capturing data for different input/output signals for the DUT. Data for the different input/output signals are captured in accordance with different data capturing mechanisms dependent upon the different modes specified by the user. Based on the data, waveforms for each of the different input/output signals are simultaneously displayed.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Simultaneous display of data gathered using multiple data gathering mechanisms |
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