System and method for application control in measurement devices

System and method for application control in measurement devices

A system and method for application control in measurement devices is disclosed. The method includes installing a new application using the device's graphical user interface, extending the device's menu system for the new application, launching the new application using the device's e...

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Hauptverfasser: FENDER MICHAEL R, KINSLEY GERALD R, MUTERSPAUGH HELEN K
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator FENDER MICHAEL R
KINSLEY GERALD R
MUTERSPAUGH HELEN K
description A system and method for application control in measurement devices is disclosed. The method includes installing a new application using the device's graphical user interface, extending the device's menu system for the new application, launching the new application using the device's extended menu system, and controlling the device using the new application through a remote control mechanism of the device. A system of application control in a measurement device is also disclosed.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title System and method for application control in measurement devices
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