Systems and methods for device degradation determination and resolution by event occurence recordation and timing analysis
A method and apparatus for determining the cause of degradation in a product or device. A reference time is established and recorded, then a process or function of the device or product is enabled. As anomalous events occur, a user actuates an actuator that causes the recordation of an event time wi...
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| creator | BARRETT TONY |
| description | A method and apparatus for determining the cause of degradation in a product or device. A reference time is established and recorded, then a process or function of the device or product is enabled. As anomalous events occur, a user actuates an actuator that causes the recordation of an event time with respect to the reference time. Events may be repetitive or non-repetitive. At completion of the function, the recorded times are compared to a table of known product or device cycle function times, and a correlation is made to determine the most likely cycle function related to the events recorded. This information can then be correlated to parts previously known to operate at such times thereby providing a diagnostic tool useful in maintenance or repair of the device or product. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2003231332A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2003231332A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2003231332A13</originalsourceid><addsrcrecordid>eNqNi8sKwjAQRbtxIeo_BFwLbfMFIor76rrE5LYG2kyZSQv1640PcOvq3AP3LLNHNUtEL8oEp3rEOzlRDbFymLxFQsvGmegppB3BvQ8fewUMoW58621WmBCiImtHRkgtwxK73zv6FLdpmm4WL-ts0ZhOsPlylW1Px8vhvMNANWQwFgGxvlZlnutSF1qX-0L_93oC_RJI2g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Systems and methods for device degradation determination and resolution by event occurence recordation and timing analysis</title><source>esp@cenet</source><creator>BARRETT TONY</creator><creatorcontrib>BARRETT TONY</creatorcontrib><description>A method and apparatus for determining the cause of degradation in a product or device. A reference time is established and recorded, then a process or function of the device or product is enabled. As anomalous events occur, a user actuates an actuator that causes the recordation of an event time with respect to the reference time. Events may be repetitive or non-repetitive. At completion of the function, the recorded times are compared to a table of known product or device cycle function times, and a correlation is made to determine the most likely cycle function related to the events recorded. This information can then be correlated to parts previously known to operate at such times thereby providing a diagnostic tool useful in maintenance or repair of the device or product.</description><edition>7</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031218&DB=EPODOC&CC=US&NR=2003231332A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031218&DB=EPODOC&CC=US&NR=2003231332A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BARRETT TONY</creatorcontrib><title>Systems and methods for device degradation determination and resolution by event occurence recordation and timing analysis</title><description>A method and apparatus for determining the cause of degradation in a product or device. A reference time is established and recorded, then a process or function of the device or product is enabled. As anomalous events occur, a user actuates an actuator that causes the recordation of an event time with respect to the reference time. Events may be repetitive or non-repetitive. At completion of the function, the recorded times are compared to a table of known product or device cycle function times, and a correlation is made to determine the most likely cycle function related to the events recorded. This information can then be correlated to parts previously known to operate at such times thereby providing a diagnostic tool useful in maintenance or repair of the device or product.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi8sKwjAQRbtxIeo_BFwLbfMFIor76rrE5LYG2kyZSQv1640PcOvq3AP3LLNHNUtEL8oEp3rEOzlRDbFymLxFQsvGmegppB3BvQ8fewUMoW58621WmBCiImtHRkgtwxK73zv6FLdpmm4WL-ts0ZhOsPlylW1Px8vhvMNANWQwFgGxvlZlnutSF1qX-0L_93oC_RJI2g</recordid><startdate>20031218</startdate><enddate>20031218</enddate><creator>BARRETT TONY</creator><scope>EVB</scope></search><sort><creationdate>20031218</creationdate><title>Systems and methods for device degradation determination and resolution by event occurence recordation and timing analysis</title><author>BARRETT TONY</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2003231332A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>BARRETT TONY</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BARRETT TONY</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Systems and methods for device degradation determination and resolution by event occurence recordation and timing analysis</title><date>2003-12-18</date><risdate>2003</risdate><abstract>A method and apparatus for determining the cause of degradation in a product or device. A reference time is established and recorded, then a process or function of the device or product is enabled. As anomalous events occur, a user actuates an actuator that causes the recordation of an event time with respect to the reference time. Events may be repetitive or non-repetitive. At completion of the function, the recorded times are compared to a table of known product or device cycle function times, and a correlation is made to determine the most likely cycle function related to the events recorded. This information can then be correlated to parts previously known to operate at such times thereby providing a diagnostic tool useful in maintenance or repair of the device or product.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Systems and methods for device degradation determination and resolution by event occurence recordation and timing analysis |
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