Cross-validation for naive bayes data mining model
A system, method, and computer program product provides a useful measure of the accuracy of a Naïve Bayes predictive model and reduced computational expense relative to conventional techniques. A method for measuring accuracy of a Naive Bayes predictive model comprises the steps of receiving a train...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | KUNTALA PAVANI DRESCHER GARY L |
description | A system, method, and computer program product provides a useful measure of the accuracy of a Naïve Bayes predictive model and reduced computational expense relative to conventional techniques. A method for measuring accuracy of a Naive Bayes predictive model comprises the steps of receiving a training dataset comprising a plurality of rows of data, building a Naïve Bayes predictive model using the training dataset, for each of at least a portion of the plurality of rows of data in the training dataset incrementally untraining the Naïve Bayes predictive model using the row of data and determining an accuracy of the incrementally untrained Naïve Bayes predictive model, and determining an aggregate accuracy of the Naïve Bayes predictive model. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2003212851A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2003212851A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2003212851A13</originalsourceid><addsrcrecordid>eNrjZDByLsovLtYtS8zJTEksyczPU0jLL1LIS8wsS1VISqxMLVYACicq5GbmZealK-Tmp6Tm8DCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMDYyNDIwtTQ0dDY-JUAQBlESy6</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Cross-validation for naive bayes data mining model</title><source>esp@cenet</source><creator>KUNTALA PAVANI ; DRESCHER GARY L</creator><creatorcontrib>KUNTALA PAVANI ; DRESCHER GARY L</creatorcontrib><description>A system, method, and computer program product provides a useful measure of the accuracy of a Naïve Bayes predictive model and reduced computational expense relative to conventional techniques. A method for measuring accuracy of a Naive Bayes predictive model comprises the steps of receiving a training dataset comprising a plurality of rows of data, building a Naïve Bayes predictive model using the training dataset, for each of at least a portion of the plurality of rows of data in the training dataset incrementally untraining the Naïve Bayes predictive model using the row of data and determining an accuracy of the incrementally untrained Naïve Bayes predictive model, and determining an aggregate accuracy of the Naïve Bayes predictive model.</description><edition>7</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; HANDLING RECORD CARRIERS ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031113&DB=EPODOC&CC=US&NR=2003212851A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031113&DB=EPODOC&CC=US&NR=2003212851A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KUNTALA PAVANI</creatorcontrib><creatorcontrib>DRESCHER GARY L</creatorcontrib><title>Cross-validation for naive bayes data mining model</title><description>A system, method, and computer program product provides a useful measure of the accuracy of a Naïve Bayes predictive model and reduced computational expense relative to conventional techniques. A method for measuring accuracy of a Naive Bayes predictive model comprises the steps of receiving a training dataset comprising a plurality of rows of data, building a Naïve Bayes predictive model using the training dataset, for each of at least a portion of the plurality of rows of data in the training dataset incrementally untraining the Naïve Bayes predictive model using the row of data and determining an accuracy of the incrementally untrained Naïve Bayes predictive model, and determining an aggregate accuracy of the Naïve Bayes predictive model.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDByLsovLtYtS8zJTEksyczPU0jLL1LIS8wsS1VISqxMLVYACicq5GbmZealK-Tmp6Tm8DCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMDYyNDIwtTQ0dDY-JUAQBlESy6</recordid><startdate>20031113</startdate><enddate>20031113</enddate><creator>KUNTALA PAVANI</creator><creator>DRESCHER GARY L</creator><scope>EVB</scope></search><sort><creationdate>20031113</creationdate><title>Cross-validation for naive bayes data mining model</title><author>KUNTALA PAVANI ; DRESCHER GARY L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2003212851A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><toplevel>online_resources</toplevel><creatorcontrib>KUNTALA PAVANI</creatorcontrib><creatorcontrib>DRESCHER GARY L</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KUNTALA PAVANI</au><au>DRESCHER GARY L</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Cross-validation for naive bayes data mining model</title><date>2003-11-13</date><risdate>2003</risdate><abstract>A system, method, and computer program product provides a useful measure of the accuracy of a Naïve Bayes predictive model and reduced computational expense relative to conventional techniques. A method for measuring accuracy of a Naive Bayes predictive model comprises the steps of receiving a training dataset comprising a plurality of rows of data, building a Naïve Bayes predictive model using the training dataset, for each of at least a portion of the plurality of rows of data in the training dataset incrementally untraining the Naïve Bayes predictive model using the row of data and determining an accuracy of the incrementally untrained Naïve Bayes predictive model, and determining an aggregate accuracy of the Naïve Bayes predictive model.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2003212851A1 |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS |
title | Cross-validation for naive bayes data mining model |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T20%3A40%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KUNTALA%20PAVANI&rft.date=2003-11-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2003212851A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |