Plating apparatus for wafer

A plating apparatus is provided to allow the whole area of a target plating surface of a wafer to be subjected to more uniform plating treatment and moreover enables a target plating surface of a wider area to be subjected to positive and uniform plating treatment. In the plating apparatus which has...

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Bibliographische Detailangaben
1. Verfasser: SAKAKI YASUHIKO
Format: Patent
Sprache:eng
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