Device, computer program product and method for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis
A device, method and computer program product are disclosed for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis for analyzing deviations between a nominal product shape and an actual product shape of a product using surface data of...
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creator | GABRIELSSON GORAN BANKESTROM OLLE GOTHBERG ANDERS |
description | A device, method and computer program product are disclosed for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis for analyzing deviations between a nominal product shape and an actual product shape of a product using surface data of a physical surface, the product having been processed by the manufacturing equipment. The analysis can be based on the surface data and a set of function deviation indicating frequencies corresponding to frequencies at which function deviations occur in the one or more details. The function deviation indicating frequencies can be comprised in a frequency map. A method of configuring a frequency map is also disclosed. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2003016843A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2003016843A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2003016843A13</originalsourceid><addsrcrecordid>eNqNTkFuAjEM3AuHqvAHS7220i5boV4RFHFve0ZW4kCkjR0SB2n_w0OboD6gp7FnxjN-6u57unlDr2AkxKKUICY5JwwNbTEKyBYC6UUsOEng2XqD6vkMCK6wUS8MtqbgYxIHwgTVGSRRFRT9lBsdkItDoyW1Y7oWHwOxQsltd6kyxGZ-fFIjuFXjNGefl93C4ZRp9YfP3cvh83t3fKMoJ8oRDTHp6edr3fdjP2w-3sftMP7P9Qtu71iZ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Device, computer program product and method for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis</title><source>esp@cenet</source><creator>GABRIELSSON GORAN ; BANKESTROM OLLE ; GOTHBERG ANDERS</creator><creatorcontrib>GABRIELSSON GORAN ; BANKESTROM OLLE ; GOTHBERG ANDERS</creatorcontrib><description>A device, method and computer program product are disclosed for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis for analyzing deviations between a nominal product shape and an actual product shape of a product using surface data of a physical surface, the product having been processed by the manufacturing equipment. The analysis can be based on the surface data and a set of function deviation indicating frequencies corresponding to frequencies at which function deviations occur in the one or more details. The function deviation indicating frequencies can be comprised in a frequency map. A method of configuring a frequency map is also disclosed.</description><edition>7</edition><language>eng</language><subject>COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOTDIRECTED TO A PARTICULAR RESULT ; DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g.ARRANGEMENTS FOR COPYING OR CONTROLLING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MACHINE TOOLS ; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OFPARTICULAR DETAILS OR COMPONENTS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; METAL-WORKING NOT OTHERWISE PROVIDED FOR ; PERFORMING OPERATIONS ; PHYSICS ; TESTING ; TRANSPORTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030123&DB=EPODOC&CC=US&NR=2003016843A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030123&DB=EPODOC&CC=US&NR=2003016843A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GABRIELSSON GORAN</creatorcontrib><creatorcontrib>BANKESTROM OLLE</creatorcontrib><creatorcontrib>GOTHBERG ANDERS</creatorcontrib><title>Device, computer program product and method for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis</title><description>A device, method and computer program product are disclosed for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis for analyzing deviations between a nominal product shape and an actual product shape of a product using surface data of a physical surface, the product having been processed by the manufacturing equipment. The analysis can be based on the surface data and a set of function deviation indicating frequencies corresponding to frequencies at which function deviations occur in the one or more details. The function deviation indicating frequencies can be comprised in a frequency map. A method of configuring a frequency map is also disclosed.</description><subject>COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOTDIRECTED TO A PARTICULAR RESULT</subject><subject>DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g.ARRANGEMENTS FOR COPYING OR CONTROLLING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MACHINE TOOLS</subject><subject>MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OFPARTICULAR DETAILS OR COMPONENTS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>METAL-WORKING NOT OTHERWISE PROVIDED FOR</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNTkFuAjEM3AuHqvAHS7220i5boV4RFHFve0ZW4kCkjR0SB2n_w0OboD6gp7FnxjN-6u57unlDr2AkxKKUICY5JwwNbTEKyBYC6UUsOEng2XqD6vkMCK6wUS8MtqbgYxIHwgTVGSRRFRT9lBsdkItDoyW1Y7oWHwOxQsltd6kyxGZ-fFIjuFXjNGefl93C4ZRp9YfP3cvh83t3fKMoJ8oRDTHp6edr3fdjP2w-3sftMP7P9Qtu71iZ</recordid><startdate>20030123</startdate><enddate>20030123</enddate><creator>GABRIELSSON GORAN</creator><creator>BANKESTROM OLLE</creator><creator>GOTHBERG ANDERS</creator><scope>EVB</scope></search><sort><creationdate>20030123</creationdate><title>Device, computer program product and method for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis</title><author>GABRIELSSON GORAN ; BANKESTROM OLLE ; GOTHBERG ANDERS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2003016843A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOTDIRECTED TO A PARTICULAR RESULT</topic><topic>DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g.ARRANGEMENTS FOR COPYING OR CONTROLLING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MACHINE TOOLS</topic><topic>MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OFPARTICULAR DETAILS OR COMPONENTS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>METAL-WORKING NOT OTHERWISE PROVIDED FOR</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>GABRIELSSON GORAN</creatorcontrib><creatorcontrib>BANKESTROM OLLE</creatorcontrib><creatorcontrib>GOTHBERG ANDERS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GABRIELSSON GORAN</au><au>BANKESTROM OLLE</au><au>GOTHBERG ANDERS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Device, computer program product and method for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis</title><date>2003-01-23</date><risdate>2003</risdate><abstract>A device, method and computer program product are disclosed for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis for analyzing deviations between a nominal product shape and an actual product shape of a product using surface data of a physical surface, the product having been processed by the manufacturing equipment. The analysis can be based on the surface data and a set of function deviation indicating frequencies corresponding to frequencies at which function deviations occur in the one or more details. The function deviation indicating frequencies can be comprised in a frequency map. A method of configuring a frequency map is also disclosed.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOTDIRECTED TO A PARTICULAR RESULT DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g.ARRANGEMENTS FOR COPYING OR CONTROLLING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MACHINE TOOLS MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OFPARTICULAR DETAILS OR COMPONENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METAL-WORKING NOT OTHERWISE PROVIDED FOR PERFORMING OPERATIONS PHYSICS TESTING TRANSPORTING |
title | Device, computer program product and method for indicating a function deviation of one or more details of manufacturing equipment using frequency component analysis |
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