Method for manufacturing an isolation trench filled with a high-density plasma-chemical vapor deposition oxide

A method for filling an isolation trench in a semiconductor substrate includes the steps of forming a first silicon oxide layer on sidewalls and the floor of each trench by an oxidation step, forming a second silicon oxide layer on the sidewalls and floor of the trench by a first high-density plasma...

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Bibliographische Detailangaben
Hauptverfasser: TRUEBY ALEXANDER, WICH-GLASEN ANDREAS, MOLL HANS-PETER
Format: Patent
Sprache:eng
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