Method and apparatus for non-destructive testing of leaded packages
A method of non-destructively testing the adhesion of electrical leads joined to a package comprising the steps of holding the package and a portion of a lead in respective stationary positions, applying a force to the lead proximate an area where it's joined to the package, and measuring the r...
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creator | SZWEC RICHARD JAMES DONOHO EDWARD HUNT |
description | A method of non-destructively testing the adhesion of electrical leads joined to a package comprising the steps of holding the package and a portion of a lead in respective stationary positions, applying a force to the lead proximate an area where it's joined to the package, and measuring the resistance of the lead to the force. An apparatus for holding the package and leads during such testing comprising first and second holding members, each having three arms connected by a transverse member. |
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An apparatus for holding the package and leads during such testing comprising first and second holding members, each having three arms connected by a transverse member.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20021219&DB=EPODOC&CC=US&NR=2002189364A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20021219&DB=EPODOC&CC=US&NR=2002189364A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SZWEC RICHARD JAMES</creatorcontrib><creatorcontrib>DONOHO EDWARD HUNT</creatorcontrib><title>Method and apparatus for non-destructive testing of leaded packages</title><description>A method of non-destructively testing the adhesion of electrical leads joined to a package comprising the steps of holding the package and a portion of a lead in respective stationary positions, applying a force to the lead proximate an area where it's joined to the package, and measuring the resistance of the lead to the force. An apparatus for holding the package and leads during such testing comprising first and second holding members, each having three arms connected by a transverse member.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD2TS3JyE9RSMwD4oKCxKLEktJihbT8IoW8_DzdlNTikqLS5JLMslSFEiA7My9dIT9NISc1MSU1RaEgMTk7MT21mIeBNS0xpziVF0pzMyi7uYY4e-imFuTHpxYDlaXmpZbEhwYbGRgYGVpYGpuZOBoaE6cKAEeqM2s</recordid><startdate>20021219</startdate><enddate>20021219</enddate><creator>SZWEC RICHARD JAMES</creator><creator>DONOHO EDWARD HUNT</creator><scope>EVB</scope></search><sort><creationdate>20021219</creationdate><title>Method and apparatus for non-destructive testing of leaded packages</title><author>SZWEC RICHARD JAMES ; DONOHO EDWARD HUNT</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2002189364A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SZWEC RICHARD JAMES</creatorcontrib><creatorcontrib>DONOHO EDWARD HUNT</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SZWEC RICHARD JAMES</au><au>DONOHO EDWARD HUNT</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for non-destructive testing of leaded packages</title><date>2002-12-19</date><risdate>2002</risdate><abstract>A method of non-destructively testing the adhesion of electrical leads joined to a package comprising the steps of holding the package and a portion of a lead in respective stationary positions, applying a force to the lead proximate an area where it's joined to the package, and measuring the resistance of the lead to the force. An apparatus for holding the package and leads during such testing comprising first and second holding members, each having three arms connected by a transverse member.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
title | Method and apparatus for non-destructive testing of leaded packages |
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