Method of detecting a distortion of a light pattern defining a code word

A method for detecting a distortion of a light pattern defining a code word includes projecting a light pattern onto an object via a light source and detecting the projected light pattern and comparing the detected light pattern with a reference light pattern. The reference light pattern has individ...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Richter, Martin, Zimprich, Martin, Ott, Konstantin
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Richter, Martin
Zimprich, Martin
Ott, Konstantin
description A method for detecting a distortion of a light pattern defining a code word includes projecting a light pattern onto an object via a light source and detecting the projected light pattern and comparing the detected light pattern with a reference light pattern. The reference light pattern has individual, spaced-apart light pattern elements arranged in a plurality of successive columns in the direction of a first extension axis and the number and/or position of the at least one light pattern element in each column of the reference light pattern is an encoding feature that defines at least one code word. The distortion of the detected light pattern with respect to the reference light pattern is determined by comparing distances between the light pattern elements of the detected light pattern with distances between the light pattern elements of the reference light pattern.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US12163775B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US12163775B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US12163775B23</originalsourceid><addsrcrecordid>eNrjZPDwTS3JyE9RyE9TSEktSU0uycxLV0hUSMksLskvKsnMzwPJJCrkZKZnlCgUJJaUpBblAVWmZeZBFCbnp6QqlOcXpfAwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUkvjQYEMjQzNjc3NTJyNjYtQAAFSFM8g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of detecting a distortion of a light pattern defining a code word</title><source>esp@cenet</source><creator>Richter, Martin ; Zimprich, Martin ; Ott, Konstantin</creator><creatorcontrib>Richter, Martin ; Zimprich, Martin ; Ott, Konstantin</creatorcontrib><description>A method for detecting a distortion of a light pattern defining a code word includes projecting a light pattern onto an object via a light source and detecting the projected light pattern and comparing the detected light pattern with a reference light pattern. The reference light pattern has individual, spaced-apart light pattern elements arranged in a plurality of successive columns in the direction of a first extension axis and the number and/or position of the at least one light pattern element in each column of the reference light pattern is an encoding feature that defines at least one code word. The distortion of the detected light pattern with respect to the reference light pattern is determined by comparing distances between the light pattern elements of the detected light pattern with distances between the light pattern elements of the reference light pattern.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241210&amp;DB=EPODOC&amp;CC=US&amp;NR=12163775B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241210&amp;DB=EPODOC&amp;CC=US&amp;NR=12163775B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Richter, Martin</creatorcontrib><creatorcontrib>Zimprich, Martin</creatorcontrib><creatorcontrib>Ott, Konstantin</creatorcontrib><title>Method of detecting a distortion of a light pattern defining a code word</title><description>A method for detecting a distortion of a light pattern defining a code word includes projecting a light pattern onto an object via a light source and detecting the projected light pattern and comparing the detected light pattern with a reference light pattern. The reference light pattern has individual, spaced-apart light pattern elements arranged in a plurality of successive columns in the direction of a first extension axis and the number and/or position of the at least one light pattern element in each column of the reference light pattern is an encoding feature that defines at least one code word. The distortion of the detected light pattern with respect to the reference light pattern is determined by comparing distances between the light pattern elements of the detected light pattern with distances between the light pattern elements of the reference light pattern.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDwTS3JyE9RyE9TSEktSU0uycxLV0hUSMksLskvKsnMzwPJJCrkZKZnlCgUJJaUpBblAVWmZeZBFCbnp6QqlOcXpfAwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUkvjQYEMjQzNjc3NTJyNjYtQAAFSFM8g</recordid><startdate>20241210</startdate><enddate>20241210</enddate><creator>Richter, Martin</creator><creator>Zimprich, Martin</creator><creator>Ott, Konstantin</creator><scope>EVB</scope></search><sort><creationdate>20241210</creationdate><title>Method of detecting a distortion of a light pattern defining a code word</title><author>Richter, Martin ; Zimprich, Martin ; Ott, Konstantin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US12163775B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Richter, Martin</creatorcontrib><creatorcontrib>Zimprich, Martin</creatorcontrib><creatorcontrib>Ott, Konstantin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Richter, Martin</au><au>Zimprich, Martin</au><au>Ott, Konstantin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of detecting a distortion of a light pattern defining a code word</title><date>2024-12-10</date><risdate>2024</risdate><abstract>A method for detecting a distortion of a light pattern defining a code word includes projecting a light pattern onto an object via a light source and detecting the projected light pattern and comparing the detected light pattern with a reference light pattern. The reference light pattern has individual, spaced-apart light pattern elements arranged in a plurality of successive columns in the direction of a first extension axis and the number and/or position of the at least one light pattern element in each column of the reference light pattern is an encoding feature that defines at least one code word. The distortion of the detected light pattern with respect to the reference light pattern is determined by comparing distances between the light pattern elements of the detected light pattern with distances between the light pattern elements of the reference light pattern.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US12163775B2
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Method of detecting a distortion of a light pattern defining a code word
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T16%3A58%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Richter,%20Martin&rft.date=2024-12-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS12163775B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true