Context-based test suite generation as a service

A system comprising processing circuitry a memory storing instructions that cause the system to detect a code change to source code included in a code repository, identify a relationship between the code change and an associated product feature, determine one or more dependent product features impac...

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Hauptverfasser: Prabhakar, Krishnaprasad Bidare, Nidugala, Muralikrishna, Sahu, Anup Kumar, Jammulapati, Ravi Teja, Mehta, Aryan
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creator Prabhakar, Krishnaprasad Bidare
Nidugala, Muralikrishna
Sahu, Anup Kumar
Jammulapati, Ravi Teja
Mehta, Aryan
description A system comprising processing circuitry a memory storing instructions that cause the system to detect a code change to source code included in a code repository, identify a relationship between the code change and an associated product feature, determine one or more dependent product features impacted by the code change, select a set of test cases including a subset of test cases related to the associated product feature and a subset of test cases related to the one or more dependent product features, execute the set of test cases, and update the code-to-feature mapping using results of executing the set of test case.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US12117924B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US12117924B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US12117924B23</originalsourceid><addsrcrecordid>eNrjZDBwzs8rSa0o0U1KLE5NUShJLS5RKC7NLElVSE_NSy1KLMnMz1NILFZIVChOLSrLTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyUB9JfGhwYZGhobmlkYmTkbGxKgBAFktK04</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Context-based test suite generation as a service</title><source>esp@cenet</source><creator>Prabhakar, Krishnaprasad Bidare ; Nidugala, Muralikrishna ; Sahu, Anup Kumar ; Jammulapati, Ravi Teja ; Mehta, Aryan</creator><creatorcontrib>Prabhakar, Krishnaprasad Bidare ; Nidugala, Muralikrishna ; Sahu, Anup Kumar ; Jammulapati, Ravi Teja ; Mehta, Aryan</creatorcontrib><description>A system comprising processing circuitry a memory storing instructions that cause the system to detect a code change to source code included in a code repository, identify a relationship between the code change and an associated product feature, determine one or more dependent product features impacted by the code change, select a set of test cases including a subset of test cases related to the associated product feature and a subset of test cases related to the one or more dependent product features, execute the set of test cases, and update the code-to-feature mapping using results of executing the set of test case.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241015&amp;DB=EPODOC&amp;CC=US&amp;NR=12117924B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241015&amp;DB=EPODOC&amp;CC=US&amp;NR=12117924B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Prabhakar, Krishnaprasad Bidare</creatorcontrib><creatorcontrib>Nidugala, Muralikrishna</creatorcontrib><creatorcontrib>Sahu, Anup Kumar</creatorcontrib><creatorcontrib>Jammulapati, Ravi Teja</creatorcontrib><creatorcontrib>Mehta, Aryan</creatorcontrib><title>Context-based test suite generation as a service</title><description>A system comprising processing circuitry a memory storing instructions that cause the system to detect a code change to source code included in a code repository, identify a relationship between the code change and an associated product feature, determine one or more dependent product features impacted by the code change, select a set of test cases including a subset of test cases related to the associated product feature and a subset of test cases related to the one or more dependent product features, execute the set of test cases, and update the code-to-feature mapping using results of executing the set of test case.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBwzs8rSa0o0U1KLE5NUShJLS5RKC7NLElVSE_NSy1KLMnMz1NILFZIVChOLSrLTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyUB9JfGhwYZGhobmlkYmTkbGxKgBAFktK04</recordid><startdate>20241015</startdate><enddate>20241015</enddate><creator>Prabhakar, Krishnaprasad Bidare</creator><creator>Nidugala, Muralikrishna</creator><creator>Sahu, Anup Kumar</creator><creator>Jammulapati, Ravi Teja</creator><creator>Mehta, Aryan</creator><scope>EVB</scope></search><sort><creationdate>20241015</creationdate><title>Context-based test suite generation as a service</title><author>Prabhakar, Krishnaprasad Bidare ; Nidugala, Muralikrishna ; Sahu, Anup Kumar ; Jammulapati, Ravi Teja ; Mehta, Aryan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US12117924B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Prabhakar, Krishnaprasad Bidare</creatorcontrib><creatorcontrib>Nidugala, Muralikrishna</creatorcontrib><creatorcontrib>Sahu, Anup Kumar</creatorcontrib><creatorcontrib>Jammulapati, Ravi Teja</creatorcontrib><creatorcontrib>Mehta, Aryan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Prabhakar, Krishnaprasad Bidare</au><au>Nidugala, Muralikrishna</au><au>Sahu, Anup Kumar</au><au>Jammulapati, Ravi Teja</au><au>Mehta, Aryan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Context-based test suite generation as a service</title><date>2024-10-15</date><risdate>2024</risdate><abstract>A system comprising processing circuitry a memory storing instructions that cause the system to detect a code change to source code included in a code repository, identify a relationship between the code change and an associated product feature, determine one or more dependent product features impacted by the code change, select a set of test cases including a subset of test cases related to the associated product feature and a subset of test cases related to the one or more dependent product features, execute the set of test cases, and update the code-to-feature mapping using results of executing the set of test case.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Context-based test suite generation as a service
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T20%3A46%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Prabhakar,%20Krishnaprasad%20Bidare&rft.date=2024-10-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS12117924B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true