Techniques for testing semiconductor devices

Techniques for testing semiconductor devices include a semiconductor device having a plurality of components, a test bus, and a test data transfer unit. The test data transfer unit receives, from a host computer, configuration information for performing a test of the semiconductor device, reads, via...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Sarangi, Shantanu, Garg, Rahul, Kumar, Ashish, Khare, Animesh
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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