Scan flip-flops with pre-setting combinational logic

Systems, methods, and devices are described herein for pre-setting scan flip-flops using combinational logic circuits. A system includes a plurality of flip-flop devices and a first pre-setting combinational logic circuit. The plurality of flip-flop devices are coupled together in series and configu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Chen, Sheng-Hsiung, Lin, Tzu-Ying, Chen, Xiangdong, Li, Johnny Chiahao, Chien, Yung-Chen, Kao, Jerry Chang Jui
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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