Apparatus for inspecting a display panel for defects
An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions...
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creator | Koo, Minsang Sohn, Hoon Choi, Sangwoo Shin, Eunchul Kwon, Sanghyuk Park, Jiho Jung, Woojin Hwang, Soonkyu |
description | An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern. |
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A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.</description><language>eng</language><subject>ADVERTISING ; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION ; CRYPTOGRAPHY ; DISPLAY ; EDUCATION ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SEALS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240723&DB=EPODOC&CC=US&NR=12046167B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,782,887,25573,76557</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240723&DB=EPODOC&CC=US&NR=12046167B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Koo, Minsang</creatorcontrib><creatorcontrib>Sohn, Hoon</creatorcontrib><creatorcontrib>Choi, Sangwoo</creatorcontrib><creatorcontrib>Shin, Eunchul</creatorcontrib><creatorcontrib>Kwon, Sanghyuk</creatorcontrib><creatorcontrib>Park, Jiho</creatorcontrib><creatorcontrib>Jung, Woojin</creatorcontrib><creatorcontrib>Hwang, Soonkyu</creatorcontrib><title>Apparatus for inspecting a display panel for defects</title><description>An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. 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A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DISPLAY EDUCATION INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEALS TESTING |
title | Apparatus for inspecting a display panel for defects |
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