Wordline leakage test management

A processing device in a memory sub-system determines whether a media endurance metric associated with a memory block of a memory device satisfies one or more conditions. In response to the one or more conditions being satisfied, a temperature of the memory block is compared to a threshold temperatu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Yeung, Chun Sum, Chew, Francis Chee Khai, Tanadi, Trismardawi, Dumalag, Lawrence, Chin, Wai Leong, Singh, Ekamdeep
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!