System and method for measuring intermittent operating life of GaN-based device

The present invention provides a system and method for measuring an intermittent operating life (IOL) of a GaN-based device under test (DUT) is provided. The system is operable in a stressing mode, a cooling mode and a measure mode. A power regulation approach is adopted to ensure that DUT of the sa...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Yang, Rong, Bai, Donghua, Huang, Jiabiao, Li, Sichao, Chen, Chang, Zhou, Chunhua
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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