Field effect transistors with negative capacitance layers

The present disclosure describes a method includes forming a fin structure including a fin base portion and a stacked fin portion on a substrate. The stacked fin portion includes a first semiconductor layer on the fin base portion, a second semiconductor layer above the first semiconductor layer, an...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Yang, Chan-Lon, Yang, Chansyun David, Chang, Keh-Jeng
Format: Patent
Sprache:eng
Schlagworte:
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